In this Advantest Talks Semi interview, Keith Schaub speaks with Aasutosh Dave, Chief Commercial Officer at FormFactor, about the evolving role of probe cards in backend semiconductor testing.

The conversation examines how advances in AI accelerators, high‑bandwidth memory (HBM), advanced logic, and silicon photonics are driving new requirements for probe card design, including higher pin counts, tighter pitch, hybrid electrical‑optical testing, and greater reliability in high‑volume manufacturing. Aasutosh also discusses why backend test has become a critical technology enabler and how collaboration across the semiconductor ecosystem is shaping the future of wafer‑level test.

Watch the interview to learn how FormFactor is addressing today’s most complex probing challenges and enabling next‑generation semiconductor devices.