FormFactor, Inc. and MicroProbe select International Test Conference 2012 for first appearance as united company
November 2, 2012
LIVERMORE, Calif. — November 2, 2012 — FormFactor, Inc. (Nasdaq: FORM) today announced that it will attend the 2012 International Test Conference (ITC) taking place November 4-9 at the Disneyland Hotel in Anaheim, CA. This event will mark FormFactor’s and MicroProbe’s first public appearance as a united company.
The combined company’s portfolio contains a comprehensive range of products and technologies to enable and accelerate the roadmaps of System-On-Chip (SoC) and memory semiconductor device manufacturers.
At ITC, the premier discussion forum for advanced wafer test technologies, FormFactor will present case studies of the company’s leading-edge wafer-test technologies in the following sessions:
Wednesday, Nov. 7th; 12:00 noon – 2 p.m. Poster Session
“Parallel Parametric Test in Semiconductor Production” Co-presentation by technologists from Agilent and FormFactor
Friday, Nov. 9th; 8:25 a.m. – 8:50 a.m. 3D-Test Workshop
Session 4: 3D Wafer Probing
“40um Pitch Probe Card Evaluation”
Co-presentation by technologists from Altera Corp. and FormFactor
In addition to the presentations, FormFactor executives will be on hand to answer customers’ questions. To schedule a briefing on Wed. 7th or Thurs. 8th, please contact Amy Leong at email@example.com.
Further information on the 2012 ITC, including the Third IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, can be found at www.itctestweek.org.