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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

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          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Probe Sales & Service

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                Asset 4
                  Company Press Releases April 7, 2020

                  Press Releases

                  FormFactor Rated as Top Supplier of Semiconductor Probe Cards

                  April 7, 2020

                  Share


                  Company Expands Leading Market Share, with Gains in High-growth Segments of the Probe Card Market

                  LIVERMORE, Calif., April 07, 2020 (GLOBE NEWSWIRE) — FormFactor, Inc. (NASDAQ: FORM), a leading test and measurement supplier, was again ranked as the world’s number one supplier of semiconductor probe cards by market research firm VLSIresearch. FormFactor has held the top position for seven consecutive years.

                  FormFactor’s probe card revenues are primarily comprised of advanced wafer probe cards, a segment in which FormFactor’s market share grew to 32%, nearly twice that of its nearest competitor. According to VLSIresearch, advanced probe cards account for over 80% of the overall probe card market, growing at 7.6% CAGR from 2020 to 2025 to reach $2.2 billion by 2025. Notably, FormFactor further increased its lead in two high-growth segments in the probe card market – MEMS-based probe cards and non-memory probe cards used for testing ICs produced by foundry and logic IC customers.

                  “Among the key factors driving FormFactor’s growth is the emergence of advanced packaging to continue the scaling and performance gains for the semiconductor industry,” said Risto Puhakka, president of VLSIresearch. “Advanced packages, which integrate multiple ICs in one system, raise the bar for wafer test and accelerate the adoption of MEMS probe technologies. The MEMS probe card segment is projected to grow at a CAGR of approximately 10% over the next several years.”

                  “Wafer test of leading-edge semiconductors requires extraordinary electrical and mechanical performance, which is a perfect match for MEMS probe technologies,” said FormFactor CEO Mike Slessor. “Our close collaboration with customers, paired with our agile development and manufacturing model, enable us to support these challenging test requirements. FormFactor’s products, people, and responsiveness help our customers to bring these new products to market faster and accelerate their profitability.”

                  About FormFactor
                  FormFactor, Inc. (NASDAQ: FORM), is a leading provider of essential test and measurement technologies along the full IC life cycle – from metrology and inspection, characterization, modeling, reliability, and design debug, to qualification and production test. Semiconductor companies rely upon FormFactor’s products and services to accelerate profitability by optimizing device performance and advancing yield knowledge. The Company serves customers through its network of facilities in Asia, Europe, and North America. For more information, visit the Company’s website at www.formfactor.com.

                  About VLSIresearch
                  VLSIresearch is an award-winning provider of market research and economic analysis on the technical, business, and economic aspects within semiconductor, nanotechnology, and related industries. VLSIresearch provides intelligence for faster and better decision making in the areas of semiconductors, photovoltaics, LEDs, manufacturing, materials, and critical subsystems. VLSIresearch was founded in 1976.

                  Trade Contact
                  David Viera
                  Corporate Communications
                  (925) 290-4182
                  david.viera@formfactor.com

                  Investor Contact
                  Stan Finkelstein
                  Investor Relations
                  (925) 290-4321
                  ir@formfactor.com

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                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • Autonomous Assistants
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                        • Back
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                        • Chip-scale Probe Systems
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                      • With KeySight
                        • IMS-K-mmW/THz
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                        • Back
                      • Software
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                        • WinCal XE
                        • Back
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                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
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                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
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                        • DCP 100 Series Probe
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                        • Back
                      • DC MULTICONTACT
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                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • [ RF Probing ]
                      • Type/Application
                        • RF-Front End
                        • 5G mmWave
                        • RF Transceivers
                        • Auto-Radar
                        • High Speed Digital
                        • Back
                      • Platforms
                        • Pyramid RF
                        • Pyrana RF
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
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