Looking for customer support? Ready to learn more about our products and services?
Contact Sales TodaySubscribe to Our Newsletter
Our custom contact calibration substrates for Pyramid Probes® deliver higher accuracy by matching device layout, faster calibration by reducing the number of indexing steps to measure every RF port, as well as a total solution with calibration coefficients for faster time to first data.
- Ability to match DUT layout improves RF calibration for better yield
- Reduced site-to-site variation in probe cards eliminates the need for correlation
- Reduced calibration time by single touchdown on multiple standards for multi-DUT calibration
- Probe, calibration substrate and calibration coefficients in a single box (time delay of each thru, COPEN, LLOAD and LSHORT)
