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Evolvity 300 Probe System
  • Evolvity 300 Probe System
  • EVOLVITY 300
  • Evolvity 300 Probe System

The EVOLVITY™ 300 is FormFactor’s latest semi-automated engineering wafer probe system that is complementing the company’s proven CM300 product line. Designed to simplify on-wafer probing, the EVOLVITY 300 features a compact, easy-to-use system, developed specifically for RF/DC Modeling and device characterization.

Building on the trusted legacy of the Cascade S300 and Elite systems, the EVOLVITY 300 offers a flexible, space-efficient platform that integrates into existing setups. Its modular design allows for easy switching between applications like advanced RF measurements, DC characterization, and probe cards. In addition, the system offers automation options that simplify operation and provide greater flexibility for users.

  • Mechanical Platen Lift: Enhances safety during complex RF set-ups, increasing operator confidence and minimizing the risk of errors.
  • Ease of Use and Advanced Automation: Fully compatible with FormFactor’s Autonomous RF and DC measurement assistants, as well as Velox Dash™ companion app control.
  • Reconfigurable Platen Inserts: Quickly switch between TopHat, PCH, and IceShield inserts within minutes to support a wide variety of test configurations.
  • Spacious Platen Design: Provides flexibility for both RF and DC setups without space limitations, ensuring easy integration of different configurations.
  • Compact Design: Small footprint with field-upgradable components for smooth integration into existing test cells.
  • Low-Volume MicroChamber and FemtoGuard Thermal Triaxial Chuck: Included by default

  • Failure Analysis
  • IV/CV
  • RF/mmW/THz
  • Load-Pull
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Autonomous DC Measurement Assistant

FormFactor’s Autonomous DC Measurement Assistant enables true hands-free 24/7 wafer probing over temperature and on small pads down to 30 µm. It reduces cost of test and increases throughput by automatically aligning probes-to-pads and managing thermal transition and soak times – without any operator intervention. By dynamically controlling each probe touchdown Auto DC improves test data with optimized contact resistance. Auto DC enables remote operation from home or anywhere in the world.

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Autonomous RF Measurement Assistant

FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.

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Autonomous RF Calibration and Wafer Probing Over Temperature at High Frequency

Anthony Lord, Director of the RF Market Segment at FormFactor Inc., demonstrates autonomous calibration monitoring and re-calibration over multiple temperatures at frequencies up to 330GHz.

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170 GHz / 220 GHz Broadband Vector Network Analysis Solution

FormFactor, Keysight Technologies, DMPI, and Virginia Diodes, have joined forces to deliver a new 170 GHz / 220 GHz Broadband Vector Network Analysis (VNA) Solution that shortens design and verification cycles for 5G and emerging 6G applications.

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220 GHz Broadband On-Wafer Probing System

Get a sneak preview of our new 220 GHz Broadband On-Wafer Probing System shown at the European Microwave Week Symposium. FormFactor’s Giancarlo DeChirico and Gavin Fisher guide the tour and outline the system’s features and benefits.

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Remote Wafer Probing with Autonomous RF

FormFactor demonstrates remote wafer probing at high frequencies and over temperature, showing automatic calibration and remote operation at EuMW 2022 in Milan.

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Broadband S-parameter Measurement to 130 GHz

FormFactor RF Market Director Anthony Lord reviews the challenges of making very high frequency measurements over a broad band, especially at millimeter waves. He discusses the need for device modelling and circuit characterization with high accuracy and repeatability, as well as the challenges of making these measurements over temperature (-40 to as high as +175 degrees C).

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Load-pull Probe Station for Characterization of 5G Devices and Circuits at Wafer-Level

Characterize your 5G devices and circuits at wafer-level! FormFactor has partnered up with Focus Microwaves and Keysight to provide the most advanced turn-key solution for high-frequency fundamental and harmonic load pull measurements up to 110 GHz. The Delta tuners from Focus Microwaves are specifically designed for on-wafer integration, which allows them to be located as close to the wafer as physically possible. This minimizes insertion loss and maximizes gamma, allowing the largest cover of tunable impedances over the Smith chart. The solution is compatible with FormFactor’s high-resolution eVue Microscope with patent-pending Crash Detection to protect your valuable equipment. A thermal option is available from -40°C to +125°C: FormFactor’s patented RF TopHat guarantees a dark, shielded and frost-free measurement environment.

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Velox Dash™ – Intuitive Touchscreen Control for Probe Stations

Get to know Velox Dash, the intuitive touchscreen companion app designed to elevate your workflow. In this video, we’ll walk you through how to use Velox Dash, explore its powerful features, and show you why it stands out. With a sleek, modern design and responsive controls, Velox Dash makes operating engineering probe stations faster, smarter, and more enjoyable.