1/f Device Characterization
Integrating diverse measurement equipment with a probe station is rather complex, due to the multiple interactions between the various components. On-wafer 1/f noise measurements are a critical component of any characterization and modeling test system. Due to the required sensitivity, they can easily be corrupted by outside sources of interference. To overcome these challenges we need to have a comprehensive solution consisting of a well-known and pre-validated configuration, ensuring that all components are included to make the best possible measurement.
MeasureOne Benefits
- Guaranteed configuration
- Accurate and repeatable wafer-level 1/f and RTN measurements
- System configuration pre-validated
- Installation by industry leaders
- Solutions experts for optimization
Solution Components
- Cascade 200 mm or 300 mm semi-automated probe system
- Velox™ Software
- DCP Probes, ACP Probes, Infi nity Probes®, or |Z|Probes®
- DPP Precision DC Positioners
- Keysight Technologies E4727A Advanced Low-Frequency Analyzer (A-LFNA)
- Keysight Technologies B1500A Semiconductor Device Parameter Analyzer
- Keysight Technologies WaferPro Express software with A-LFNA