Cascade
CM300xi-SiPh
300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant
CM300xi-SiPh Overview
Proven technology and verified measurements make a difference
The CM300xi-SiPh is the first verified integrated measurement solution on the market that enables production-proven, optimized optical measurements right after installation – without further development.The unique Autonomous SiPh Measurement Assistant provides a groundbreaking set of calibration and alignment tools, the powerful SiPh-Tools software package, and all tools and fixtures needed to enable you to measure your photonic devices in days instead of months or years.
Applications: Silicon PhotonicsCM300xi-SiPh Key Features
Validated integration
- All necessary tools, fixtures and calibration techniques included
- No further development needed –start measurements right after installation
Verified performance
- Specified performance parameters
- Validation tests before shipment and after installation
Automated calibrations and alignments
- Automated optical probe calibrations and alignments along with wafer and probe height training
- Unique Pivot Point Calibration
- Optical scan, gradient search functions and sub-die management for combined optical and automated electrical probing
Reconfigurable Fiber Arms with Light Guide Technology
- Flexibility for engineering and volume environments
- Configurable between single fibers and fiber arrays
- Specially designed Z-Displacement Kit regulates the distance between wafer and fiber(s)
SiPh-Tools software package
- Automates manual tasks by integrating probe station vision capability with optical positioning and test equipment
- Wide range of tools for capturing, logging and interpreting the collected data
