Asset 4
    CM300xi-SiPh
    CM300xi-SiPh
    CM300xi-SiPh

    Cascade

    CM300xi-SiPh

    300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

    OverviewKey FeaturesVideosDownloads

    CM300xi-SiPh Overview

    Proven technology and verified measurements make a difference

    The CM300xi-SiPh 300 mm Probe station is the first verified integrated measurement solution on the market that enables production-proven, optimized optical measurements right after installation – without further development. The unique Autonomous SiPh Measurement Assistant provides a groundbreaking set of calibration and alignment tools, the powerful SiPh-Tools software package, and all tools and fixtures needed to enable you to measure your photonic devices in days instead of months or years.

    Applications: Silicon Photonics

    CM300xi-SiPh Key Features

    CM300xi-SiPh_keyfeature-integration

    Validated integration

    • All necessary tools, fixtures and calibration techniques included
    • No further development needed –start measurements right after installation

     

    CM300xi-SiPh_keyfeature-performance

    Verified performance

    • Specified performance parameters
    • Validation tests before shipment and after installation

     

    CM300xi-SiPh_keyfeature-alignment

    Automated calibrations and alignments

    • Automated optical probe calibrations and alignments along with wafer and probe height training
    • Unique Pivot Point Calibration
    • Optical scan, gradient search functions and sub-die management for combined optical and automated electrical probing
    CM300xi-SiPh_keyfeature-fiberarm

    Reconfigurable Fiber Arms with Light Guide Technology

    • Flexibility for engineering and volume environments
    • Configurable between single fibers and fiber arrays
    • Specially designed Z-Displacement Kit regulates the distance between wafer and fiber(s)
    CM300xi-SiPh_keyfeature-software

    SiPh-Tools software package

    • Automates manual tasks by integrating probe station vision capability with optical positioning and test equipment
    • Wide range of tools for capturing, logging and interpreting the collected data

    Videos

    Autonomous Silicon Photonics Measurement Assistant

    FormFactor's Autonomous Silicon Photonics Measurement Assistant enables and optimizes silicon photonics coupling. The use of single optical fibers and fiber arrays as probes to couple light into and out of a wafer surface creates many challenges that FormFactor manages through its Contact Intelligence technology.

    imec’s Silicon Photonics Research and Manufacturing Program

    See how our customer imec is using our CM300 to enable their development of silicon photonics solutions

    Downloads

    CM300xi-SiPh Data Sheet
    Autonomous SiPh Measurement Assistant Brochure
    Autonomous SiPh Measurements Brief
    Cascade Probe Systems Brochure
    Probe Station Accessory Catalog
    Contact Intelligence This probe station supports Contact Intelligence™, an innovative technology that senses environmental changes and reacts to optimize probe contact accuracy for autonomous semiconductor test. FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to create a technology that provides benefits across a wide array of applications, even when probing small pads. Contact Intelligence accelerates time to accurate data, in some cases, reducing test time from months to minutes. Learn More about Contact Intelligence

    Related Products/Applications

    Autonomous SiPh Measurement Assistant

    FormFactor introduces a new assistant for enabling and optimizing silicon photonics coupling. The use of single optical fibers and fiber arrays as probes to couple light into and out of a wafer surface creates many challenges that FormFactor manages through its Contact Intelligence technology. Learn More about Autonomous SiPh Measurement Assistant
    Silicon Photonics

    The semiconductor industry is at the gateway of a technology shift in the form of silicon photonics (SiPh), which holds the potential for spectacular gains in speed, power efficiency and density. The first wave of the SiPh revolution stands poised to roll over data centers around the world with optical interconnects that breach the barriers set by copper wire. End user benefits might include an HD movie or 100 hours of music downloaded in a single second. Bandwidths of a terabit per second now come within practical reach. Learn More about Silicon Photonics
    CM300xi Probe Systems

    The CM300xi series probe systems with Contact Intelligence meet the measurement challenges brought on by extremely complex environments, such as unattended testing on small pads over time and at multiple temperatures. Learn More about CM300xi Probe Systems

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