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Cascade Probe Systems

Probe systems

We offer a complete line of premium performance analytical probe solutions for on-wafer probing, board test and package test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Test Expertise

        Test Expertise

        FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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          Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Asset 4
                CM300xi-SiPh
                CM300xi-SiPh
                CM300xi-SiPh
                Products Probe Systems 300 mm Systems CM300xi-SiPh

                Cascade

                CM300xi-SiPh

                300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

                CM300xi-SiPh
                CM300xi-SiPh
                CM300xi-SiPh
                OverviewKey FeaturesVideosDownloads

                CM300xi-SiPh Overview

                Proven technology and verified measurements make a difference

                The CM300xi-SiPh is the first verified integrated measurement solution on the market that enables production-proven, optimized optical measurements right after installation – without further development.The unique Autonomous SiPh Measurement Assistant provides a groundbreaking set of calibration and alignment tools, the powerful SiPh-Tools software package, and all tools and fixtures needed to enable you to measure your photonic devices in days instead of months or years.

                Applications: Silicon Photonics

                CM300xi-SiPh Key Features

                CM300xi-SiPh_keyfeature-integration

                Validated integration

                • All necessary tools, fixtures and calibration techniques included
                • No further development needed –start measurements right after installation

                 

                CM300xi-SiPh_keyfeature-performance

                Verified performance

                • Specified performance parameters
                • Validation tests before shipment and after installation

                 

                CM300xi-SiPh_keyfeature-alignment

                Automated calibrations and alignments

                • Automated optical probe calibrations and alignments along with wafer and probe height training
                • Unique Pivot Point Calibration
                • Optical scan, gradient search functions and sub-die management for combined optical and automated electrical probing
                CM300xi-SiPh_keyfeature-fiberarm

                Reconfigurable Fiber Arms with Light Guide Technology

                • Flexibility for engineering and volume environments
                • Configurable between single fibers and fiber arrays
                • Specially designed Z-Displacement Kit regulates the distance between wafer and fiber(s)
                CM300xi-SiPh_keyfeature-software

                SiPh-Tools software package

                • Automates manual tasks by integrating probe station vision capability with optical positioning and test equipment
                • Wide range of tools for capturing, logging and interpreting the collected data

                Videos

                Autonomous Silicon Photonics Measurement Assistant

                FormFactor's Autonomous Silicon Photonics Measurement Assistant enables and optimizes silicon photonics coupling. The use of single optical fibers and fiber arrays as probes to couple light into and out of a wafer surface creates many challenges that FormFactor manages through its Contact Intelligence technology.

                Downloads

                CM300xi-SiPh Data Sheet
                Autonomous SiPh Measurement Assistant Brochure
                Autonomous SiPh Measurements Brief
                Cascade Probe Systems Brochure
                Probe Station Accessory Catalog
                Contact Intelligence This system supports Contact Intelligence™, an innovative technology that senses environmental changes and reacts to optimize probe contact accuracy for autonomous semiconductor test. FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to create a technology that provides benefits across a wide array of applications, even when probing small pads. Contact Intelligence accelerates time to accurate data, in some cases, reducing test time from months to minutes. Learn More about Contact Intelligence

                Related Products

                 

                FormFactor introduces a new assistant for enabling and optimizing silicon photonics coupling. The use of single optical fibers and fiber arrays as probes to couple light into and out of a wafer surface creates many challenges that FormFactor manages through its Contact Intelligence technology. Learn More about Autonomous SiPh Measurement Assistant
                The CM300xi series probe systems with Contact Intelligence meet the measurement challenges brought on by extremely complex environments, such as unattended testing on small pads over time and at multiple temperatures. Learn More about CM300xi Probe Systems

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                • Products
                  • Probe Systems
                    • (By Wafer Size)
                    • 150 MM Probe Systems
                      • MPS150/EPS150
                      • RFgenius
                      • Back
                    • 200 MM Probe Systems
                      • PM8/EPS200
                      • BlueRay
                      • Summit
                      • See All…
                      • Back
                    • 300 MM Probe Systems
                      • PM300
                      • CM300
                      • See All…
                      • Back
                    • (By Application)
                    • AUTONOMOUS ASSISTANTS
                      • Autonomous DC
                      • Autonomous RF
                      • Autonomous SiPh
                      • Back
                    • Board Level Systems
                      • Board Test Systems
                      • Back
                    • Reliability Test Systems
                      • 1164
                      • Application Modules
                      • See All…
                      •  
                      •  
                      • Back
                    • Power Systems
                      • Tesla
                      • Back
                    • Advanced Test
                      • Vacuum/Cryo/Pressure Systems
                      • Back
                    • Software
                      • Velox
                      • WinCal XE
                      • Back
                    • Accessories
                      • eVue Microscope
                      • Positioners
                      • Chucks
                      • Vibration Isolation Tables
                      • ShieldEnclosure™
                      • Back
                    • Additional Products/Programs
                      • Custom Probe Systems
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Educational Savings
                      • Back
                    • Back
                  • Probes
                    • ACP
                      • ACP Probe – Coaxial
                      • ACP Probe – Cryo/Vacuum
                      • Back
                    • INFINITY
                      • Infinity Probe – Coaxial
                      • Infinity Waveguide Probe
                      • Back
                    • |Z| PROBE
                      • |Z| Probe – Coaxial
                      • |Z| Probe® PCB
                      • |Z| Probe® Power
                      • Back
                    • T-WAVE
                      • T-Wave Probe
                      • Back
                    • RF MULTICONTACT
                      • InfinityQuad
                      • ACP-Q Probe
                      • Unity Probe
                      • Multi-|Z| Probe
                      • |Z| ProbeWedge
                      • QuadCard™
                      • Back
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                      • Back
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                      • Back
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                      • Back
                    • SPECIALTY
                      • Resistive Matching and Termination
                      • Light Wave Probe
                      • Back
                    • SIGNAL INTEGRITY
                      • FPC Probe
                      • Back
                    • CALIBRATION TOOLS
                      • Impedance Standard Substrates
                      • CSR Cal Substrates
                      • Multiline TRL Cal Substrates
                      • WinCal XE
                      • Back
                    • Back
                  • Probe Cards
                    • DRAM
                      • PH Series
                      • SmartMatrix
                      • Back
                    • FLASH
                      • TouchMatrix
                      • Back
                    • FOUNDRY & LOGIC
                      • Altius
                      • Katana
                      • QiLin
                      • Cantilever
                      • Apollo
                      • TrueScale
                      • Vx-MP
                      • Back
                    • PARAMETRIC
                      • Pyramid Parametric
                      • Takumi
                      • Back
                    • RF / MMW / RADAR
                      • Katana-RF
                      • Pyrana
                      • Pyramid Accel Test Fixture
                      • Pyramid-MW
                      • Pyramid RF P-Series
                      • Back
                    • CALIBRATION TOOLS
                      • Pyramid Calibration Substrate
                      • Back
                    • Back
                  • Back
                • Test Expertise
                  • Customer Collaboration
                    • Sharing Expertise
                    • Lab to Fab
                    • Back
                  • Applications
                    • High Bandwith Memory
                    • Silicon Photonics
                    • Back
                  • Technologies
                    • Contact Intelligence
                    • Back
                  • Publications
                    • Technical Papers
                    • Case Studies
                    • Back
                  • MeasureOne Solutions
                    • MeasureOne Program Overview
                    • 1/f Device Characterization
                    • Circuit Characterization
                    • Cryogenic / Magnetic Probing
                    • S-Parameter & DC Parametric
                    • Terahertz Probing
                    • Back
                  • Back
                • Company
                  • About Us
                    • Accelerating Profitability
                    • Company Profile
                    • Our History
                    • Leadership
                    • Board of Directors
                    • Corporate Citizenship
                    • Global Locations
                    • Back
                  • Investors
                    • Investor Relations
                    • Back
                  • News & Events
                    • Newsroom
                    • Upcoming Events
                    • Blog
                    • Back
                  • Careers
                    • Career Opportunities
                    • Recruitment Privacy Policy
                    • Back
                  • Back
                • Sales & Service
                  • Contact Us
                    • Global Locations
                    • Contact Sales
                    • Parts & Service Request
                    • Back
                  • Additional Products/Programs
                    • Equipment Financing
                    • Educational Savings
                    • Certified Used Equipment
                    • Trade-in/Buy Back
                    • Logistics Service
                    • Back
                  • Product Support
                    • FormFactor RMA
                    • Cascade RMA
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                    • Analytical Probe Support
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