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Velox™ is our unique probe station control software suite for 200 mm and 300 mm wafer probe stations. It is the universal standard for semi- and fully-automated systems, enabling seamless communication between the user and more than 15 different platforms.

After the successful release of our new Velox 3, our journey continues with Velox 3.1. The main focus of this release is at the modernization of the infrastructure to keep Velox up-to-date for the next years.

A software is only as good as the hardware it supports. Therefore, Velox 3.1 now includes a new camera driver package that allows the full integration of modern USB3 cameras for pattern recognition.

Here are five additional enhancements you’ll find with Velox 3.1:

1. 3D Manual Controls to provide extremely intuitive, rapid and precise manual control of the stage in X, Y and Z direction
   • New feature that compliments the manual control capabilities of our CM300xi wafer probe stations
   • Includes XY knobs and platen lift
2. Velox Settings that are intuitively accessible
   • Extended functionality
   • Combine all global Velox settings in one place
3. USB3 Vision Support for the best optical resolution for reliable pattern recognition
   • The new industrial standard
   • Supports the newest high-performance cameras
4. Autonomous RF Enhancements that deliver higher accuracy with less intervention by the user
   • Deeper integration of WinCal XE into the Autonomous RF Measurement Assistant
   • Permanent re-calibration during subsite stepping sequences
5. Compensation Tools Increase delivers significant speed and accuracy improvements for measurements on small pads
   • Adjusted compensation parameters for XY movement of the chuck

Velox is installed on more than 600 FormFactor probe stations. Strong customer relationships and continuing advancements make Velox software the clear leader in probe station control. For more information on Velox 3.1, visit the Velox Overview page on our site or download the brochure here.