Blog
Achieving Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz
September 27, 2018
The technical progress achieved in recent years makes it possible for THz technologies to be commercialized in markets for inspection, control and monitoring, non-destructive testing (NDT), and for industrial monitoring of processes such as pharmaceutical quality control (QC).
August 2, 2018
5 Challenges for Probe Tip Sub-THz Measurements
Achieving accurate and continuous measurement for sub-THz wafer-level device characterization is particularly important for device modelling applicati...
May 11, 2018
Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements
To improve Cost of Ownership, many companies are moving to multi-DUT test to increase number of wafers tested per probe card and to increase speed of...
March 8, 2018
Three Benefits of Using Custom Calibration Substrates
In general, calibration substrates need to provide a long lifetime – preferably lasting longer than a single probe card. In addition, it needs stabl...