Blog
New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications
November 22, 2019
A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to greatly improve DC biasing accuracy, S-parameters measurement accuracy and post-calibration stability up to 110 GHz.
September 19, 2019
Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features
FormFactor introduces a fully integrated modular solution for over-temperature mm-Wave and terahertz measurements that incorporates a new, exclusively...
July 11, 2019
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures
The Autonomous RF Measurement Assistant enables fully autonomous, hands-free RF calibrations & measurements over multiple temperatures. Featuring the...
May 23, 2019
3 Tips to Getting the Most from WinCalXE Probe Calibration Software
WinCalXE™ software is a comprehensive and intuitive on-wafer RF calibration and measurement tool. It allows users to achieve accurate and repeatable...
2018
September 27, 2018
Achieving Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz | READ MORE
August 2, 2018
5 Challenges for Probe Tip Sub-THz Measurements | READ MORE
May 11, 2018
Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements | READ MORE
March 8, 2018
Three Benefits of Using Custom Calibration Substrates | READ MORE