Blog
Hybrid Calibration for 4-Port On-wafer Probing
February 28, 2019
For 4-port calibration, we have combined the widely accepted LRRM calibration with the short-open-load-reciprocal thru (SOLR) calibration, creating a hybrid calibration that takes advantage of the strengths of both calibration methods for a superior 4-port calibration.
September 27, 2018
Achieving Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz
The technical progress achieved in recent years makes it possible for THz technologies to be commercialized in markets for inspection, control and mon...
August 2, 2018
5 Challenges for Probe Tip Sub-THz Measurements
Achieving accurate and continuous measurement for sub-THz wafer-level device characterization is particularly important for device modelling applicati...
May 11, 2018
Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements
To improve Cost of Ownership, many companies are moving to multi-DUT test to increase number of wafers tested per probe card and to increase speed of...