November 22, 2019
A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to greatly improve DC biasing accuracy, S-parameters measurement accuracy and post-calibration stability up to 110 GHz.
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September 19, 2019
FormFactor introduces a fully integrated modular solution for over-temperature mm-Wave and terahertz measurements that incorporates a new, exclusively developed approach to overcome the challenges in precise waveguide probing. The result is highest accuracy and reliable data.
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July 11, 2019
The Autonomous RF Measurement Assistant enables fully autonomous, hands-free RF calibrations & measurements over multiple temperatures. Featuring the unique Contact Intelligence™ Technology, it reduces cost of test and accelerates time to market with increased accuracy and reduced design cycles.
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May 23, 2019
WinCalXE™ software is a comprehensive and intuitive on-wafer RF calibration and measurement tool. It allows users to achieve accurate and repeatable S-parameter measurements, which are crucial for precision device modeling /characterization and engineering RFIC test.
Read MoreFebruary 28, 2019
Hybrid Calibration for 4-Port On-wafer Probing | READ MORE
September 27, 2018
Achieving Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz | READ MORE
August 2, 2018
5 Challenges for Probe Tip Sub-THz Measurements | READ MORE
May 11, 2018
Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements | READ MORE
March 8, 2018
Three Benefits of Using Custom Calibration Substrates | READ MORE
August 17, 2017
Understanding Different On-Wafer Calibration Values with SOLT vs. LRRM | READ MORE