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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                Asset 4

                  Blog

                  Scanning SQUID Microscope – Accelerating Quantum Computing Development

                  Scanning SQUID Microscope – Accelerating Quantum Computing Development

                  April 16, 2021

                  We just launched our first product for the emerging quantum computing market – the HPD IQ1000 – a scanning SQUID microscope, or Superconducting Quantum Interference Device. It is used to study the dynamics of trapped magnetic flux (magnetic vortices) in superconducting circuits.

                  READ MORE
                  New Integrated Measurement Systems from FormFactor and Keysight Technologies

                  April 9, 2021

                  New Integrated Measurement Systems from FormFactor and Keysight Technologies

                  FormFactor and Keysight Technologies now offer a new family of application-specific Integrated Measurement Systems (IMS), sold exclusively by FormFact...

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                  Delivering Advanced mm-Wave Load-Pull Measurements

                  March 23, 2021

                  Delivering Advanced mm-Wave Load-Pull Measurements

                  FormFactor has partnered up with Focus Microwaves and Keysight Technologies to deliver a fully integrated solution for accurate on-wafer mm-Wave load-...

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                  Testing VCSEL Devices On-Wafer

                  February 5, 2021

                  Testing VCSEL Devices On-Wafer

                  When it comes to testing VCSEL devices on wafer, however, there are multiple challenges. A major requirement is single and dual-sided testing – prob...

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                  2021

                  January 7, 2021

                  In the Lab: Working to Create a Single Photon On Demand | READ MORE

                  2020

                  December 17, 2020

                  New MeasureOne Partnership Delivers Test Solutions for Power Semiconductor Devices | READ MORE

                  November 10, 2020

                  New Webinar – Low Frequency Noise on December 8: Register Now | READ MORE

                  November 5, 2020

                  CM300xi-ULN Probe Station – Eliminating Deployment Issues by Picking the Ideal Location | READ MORE

                  October 16, 2020

                  Achieving High Throughput 1/f, RTN Noise Measurements | READ MORE

                  September 17, 2020

                  PureLine 3 Technology Eliminates 97% of Prober Environment Noise | READ MORE

                  September 10, 2020

                  New MeasureOne Partnership to Advance Silicon Photonics Test and Measurement Development | READ MORE

                  September 3, 2020

                  New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE

                  June 26, 2020

                  Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE

                  May 14, 2020

                  Probing from Home – Autonomous RF Delivers | READ MORE

                  May 7, 2020

                  On-Wafer Test of Cryogenic Devices—the Cold Facts | READ MORE

                  April 30, 2020

                  Cryogenic Wafer Testing is Heating Up | READ MORE

                  March 12, 2020

                  New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices | READ MORE

                  January 30, 2020

                  The PAC200 Probe Station for Cryogenic Probing Environments | READ MORE

                  January 23, 2020

                  Velox 3 Probe Station Control Software – Feature Videos | READ MORE

                  2019

                  November 26, 2019

                  Delivering Zero-Defect IC Wafer Test for the Today’s Automotive Market Needs | READ MORE

                  November 22, 2019

                  New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications | READ MORE

                  November 1, 2019

                  Experience the All New Velox 3 Probe Station Control Software | READ MORE

                  October 24, 2019

                  New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE

                  August 15, 2019

                  TESLA200 – 200mm Power Semiconductor Probe Station | READ MORE

                  July 11, 2019

                  Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE

                  May 9, 2019

                  Enabling and Optimizing Silicon Photonics Coupling | READ MORE

                  May 3, 2019

                  Meeting the Challenges of 5G Production Test | READ MORE

                  March 7, 2019

                  Validating IC Packaging Requirements for the Connected Car and IoT | READ MORE

                  February 14, 2019

                  Exploring Terahertz Applications in Emerging Sciences | READ MORE

                  January 4, 2019

                  Breaking the Myth of Wafer Probing on Cu for FOWLP | READ MORE

                  2018

                  December 13, 2018

                  Five Reasons Constant Voltage EM (CVEM) Replaces CIEM for IC Failure Capture – Part Two | READ MORE

                  December 7, 2018

                  Five Reasons Constant Voltage EM (CVEM) Replaces CIEM for IC Failure Capture – Part One | READ MORE

                  July 26, 2018

                  CM300xi – Enabling Automation While Compressing Cycle Times | READ MORE

                  July 12, 2018

                  Five Benefits of the New TESLA200 High-Power Semiconductor Probing System | READ MORE

                  July 9, 2018

                  Contact Intelligence for RF Probe Systems Raises the Bar | READ MORE

                  May 3, 2018

                  CM300xi Wafer Probe Station with Contact Intelligence Aids High-Volume Engineering | READ MORE

                  April 12, 2018

                  Free Webcast: Accelerate Time to Market with Advanced High-Frequency Measurement Solutions | READ MORE

                  March 1, 2018

                  Scaling Up the Photonic Integrated Circuit Industry with Optimized Test Methods | READ MORE

                  February 23, 2018

                  Silicon Photonics (SiPh) – From the Lab to the Fab | READ MORE

                  January 18, 2018

                  Two Examples of Moving Emerging Technology from the Lab to the Fab | READ MORE

                  2017

                  November 30, 2017

                  FormFactor in Chip Scale Review: Evaluating Advanced Probe Cards for Large-Array Fine-Pitch Micro-Bumps | READ MORE

                  November 16, 2017

                  3 Key Advantages of Wafer-Level Reliability (WLR) Electromigration (EM) Testing vs. Package-Level Reliability (PLR) | READ MORE

                  November 2, 2017

                  Ramping up Millimeter-Wave Testing for Automobile Radar Systems | READ MORE

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