July 12, 2021
Product and packaging counterfeiting is big business for the bad guys and detrimental to brands and consumers. Today’s manufacturers are continually on the hunt for ways to label their products in such a way that protects their reputation and brands, and saving countless money in lost revenue.
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February 27, 2020
Altius enables cost-effective wafer or die test of a variety of components in a heterogenous integrated system, from validating at-speed performance of high bandwidth memory (HBM), to ensuring the integrity of high-density interconnects such as silicon interposers and embedded bridges.
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February 24, 2020
The impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage. From a test perspective, making chiplets a mainstream technology depends on ensuring Good Enough Die at a reasonable test cost.
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December 6, 2019
Thanks to its parallel illumination, the WLI PL is excellently suited for the measurement of plasma diced etch trenches with a high aspect ratio, since a large proportion of the light reaches the bottom of the etching structure and the depth can thus be measured.
Read MoreSeptember 26, 2019
At the Forefront of Testing New Advanced Packages | READ MORE