Contact Us
  • CM300xi ULN - 300 mm Automated Probe Station for Flicker and Pha

    The Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station

    June 17, 2021

    The CM300xi-ULN with PureLine 3 Technology eliminates 97% of the environmental noise experienced in previous probe stations and fundamentally transforms the lab flicker noise measurement for leading-edge technology nodes below 7 nanometers.

    Read More
  • Autonomous RF Measurement Assistant with T-Wave Probes and VDI Mini Frequency Extenders on 200 mm Probe Station SUMMIT200

    Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures

    May 14, 2021

    Only the Autonomous RF Measurement Assistant enables fully autonomous, hands-free RF calibrations & measurements over multiple temperatures. Featuring the unique Contact Intelligence™ Technology, it reduces cost of test and accelerates time to market with increased accuracy & reduced design cycles.

    Read More
  • NEW: Semiconductor Test and Measurement Webinar Series -- Register Now

    NEW: Semiconductor Test and Measurement Webinar Series – Register Now

    May 4, 2021

    We are excited to announce a new webinar series designed around semiconductor test strategies for handling the data explosion. The first two webinars are Delivering Advanced mm-Wave Load-Pull Measurements and Unattended RF Measurement and Calibration for 5G Device Characterization and More.

    Read More

2021

April 2, 2021

OptoVue Pro – Enhanced Photonics Probing Calibration Now Available for the SUMMIT200 Probe Station | READ MORE

March 12, 2021

Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

February 18, 2021

Introducing Velox 3.2 Probe Station Control Software | READ MORE

February 11, 2021

Autonomous RF Delivers Remote Probing from Anywhere | READ MORE

2020

September 3, 2020

New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE

June 26, 2020

Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE

May 28, 2020

Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None | READ MORE

May 14, 2020

Probing from Home – Autonomous RF Delivers | READ MORE

May 5, 2020

Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE

April 23, 2020

Edge Coupling Efficiencies for Wafer and Die Level Applications | READ MORE

April 16, 2020

NEW VIDEO: Autonomous RF Measurement Assistant | READ MORE

March 27, 2020

OptoVue Pro – Faster Time to Data with Real-Time In-Situ Calibration | READ MORE

March 12, 2020

New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices | READ MORE

February 20, 2020

Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE

January 23, 2020

Velox 3 Probe Station Control Software – Feature Videos | READ MORE

2019

November 1, 2019

Experience the All New Velox 3 Probe Station Control Software | READ MORE

October 24, 2019

New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE

October 10, 2019

DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE

September 19, 2019

Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE

August 23, 2019

VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE

July 11, 2019

Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE