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  • 5x Faster: Thickness Measurements of Wafers and Layers

    5x Faster: Thickness Measurements of Wafers and Layers

    April 28, 2022

    The characterization of the bonded wafers is essential because it determines the process quality or the quality of the fabricated devices. Along with destructive techniques for the bond strength evaluation, like tensile or shear testing, optical measurements are often the choice of means.

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  • Understanding Wafer Applications in Surface Metrology

    March 25, 2022

    Microelectronic components and semiconductors are manufactured on round thin discs, so-called wafers. Wafers can be made of various conductive or non-conductive materials such as silicon, sapphire or glass with a typical diameter of 100, 150, 200 or 300 mm.

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  • High-Power Semiconductor Wafer Probing System

    High-Power Semiconductor Wafer Probing System for Automotive, Renewable Energy, and Industrial Applications

    March 3, 2022

    FormFactor just launched the TESLA300 high-power semiconductor probing system. Designed specifically for IGBT and power MOSFET device measurements, the TESLA300 provides accurate data at up to 10,000 V and up to 600 A current on 300mm wafers.

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2022

February 17, 2022

Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

2021

November 5, 2021

Webinars – Enabling Quantum Development and Sub THz Over Temperature Wafer Test | READ MORE

September 2, 2021

On-Demand Workshop: Continuous S-Parameter Measurements to 500 GHz | READ MORE

August 26, 2021

Advanced Temperature Control for Semiconductor Wafer Test: On-Demand Workshop | READ MORE

August 5, 2021

Production Testing of Silicon Photonics Wafers | READ MORE

July 29, 2021

Eliminating 97% of Prober Environment Noise with PureLine 3 Technology | READ MORE

June 17, 2021

The Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE

June 9, 2021

New Webinar – Advances in Analytical Wafer Probing of High-Voltage/High-Current Devices | READ MORE

March 23, 2021

Delivering Advanced mm-Wave Load-Pull Measurements | READ MORE

March 12, 2021

Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

February 18, 2021

Introducing Velox 3.2 Probe Station Control Software | READ MORE

February 11, 2021

Autonomous RF Delivers Remote Probing from Anywhere | READ MORE

2020

September 17, 2020

PureLine 3 Technology Eliminates 97% of Prober Environment Noise | READ MORE

September 10, 2020

New MeasureOne Partnership to Advance Silicon Photonics Test and Measurement Development | READ MORE

September 3, 2020

New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE

June 26, 2020

Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE

May 28, 2020

Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None | READ MORE

May 5, 2020

Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE

April 23, 2020

Edge Coupling Efficiencies for Wafer and Die Level Applications | READ MORE

April 7, 2020

3D Manual Controls – Making Manual Adjustments on Automated CM300xi Probe Stations | READ MORE

March 12, 2020

New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices | READ MORE

February 20, 2020

Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE

January 30, 2020

The PAC200 Probe Station for Cryogenic Probing Environments | READ MORE

January 23, 2020

Velox 3 Probe Station Control Software – Feature Videos | READ MORE

2019

December 12, 2019

Genius Education Kits – Turnkey S-parameter Measurement Systems for RF and Microwave Test | READ MORE

December 6, 2019

Advanced Packaging – Measuring Deep Etch Trenches | READ MORE

November 5, 2019

Customize a 150 mm Modular Probe Station Starting at $13,880 | READ MORE

November 1, 2019

Experience the All New Velox 3 Probe Station Control Software | READ MORE

October 24, 2019

New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE

October 10, 2019

DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE

September 19, 2019

Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE

August 23, 2019

VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE

August 15, 2019

TESLA200 – 200mm Power Semiconductor Probe Station | READ MORE

August 8, 2019

CM300xi Probe System – Delivering Measurement Accuracy and Reliability | READ MORE

July 18, 2019

Introducing the RFgenius On-Wafer S-Parameter Measurement Package | READ MORE

July 11, 2019

Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE

May 16, 2019

Addressing Circuit Characterization for Faster Time-to-Market | READ MORE

January 31, 2019

4 Benefits of the MeasureOne Wafer-Level Measurement Solution (WMS) | READ MORE

January 4, 2019

Breaking the Myth of Wafer Probing on Cu for FOWLP | READ MORE

2018

October 4, 2018

Three Benefits of the Estrada WLR Test System | READ MORE

May 24, 2018

Wafer-Level Electromigration – Lowering Operating Costs and Better Data Integrity | READ MORE

May 17, 2018

Wafer-Level Electromigration – Reducing Cycle Time for Faster Feedback | READ MORE

April 26, 2018

EM PLR and EM WLR Data Prove Interchangeable | READ MORE

March 16, 2018

MeasureOne™ Wafer-Level Measurement System – Addressing Test Challenges of Flicker Noise | READ MORE