Enabling Unattended Test Over Multiple Temperatures by Automating Thermal Transitions and Probe-to-Pad Alignment
January 10, 2020
Contact Intelligence helps sense, learn and react to alignment issues over multiple temperatures and small pad layouts. Contact Intelligence automatically adapts and adjusts to provide the most accurate probe-to-pad alignment for a broad array of wafers, materials and devices.
November 1, 2019
Experience the All New Velox 3 Probe Station Control Software
Windows 10 compatible – User-centered design – Efficient and robust. The all new Velox™ 3 is the first successfully completed step of our missio...
October 24, 2019
New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits
Focus Microwave’s Delta tuners are now integrated into our range of advanced characterization semi-automatic, and fully automatic probe stations. Th...
October 10, 2019
DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements
Probe positioners place a crucial role in providing accurate measurements. We offer a wide variety of manual and motorized probe positioners for any a...
September 19, 2019
Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE
August 23, 2019
VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE
August 8, 2019
CM300xi Probe System – Delivering Measurement Accuracy and Reliability | READ MORE
July 11, 2019
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE