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  • CM300xi ULN - 300 mm Automated Probe Station for Flicker and Pha

    The Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station

    June 17, 2021

    The CM300xi-ULN with PureLine 3 Technology eliminates 97% of the environmental noise experienced in previous probe stations and fundamentally transforms the lab flicker noise measurement for leading-edge technology nodes below 7 nanometers.

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  • Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations

    Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations

    March 12, 2021

    With a wide range of applications, and upgrade paths to meet any future needs, and now with ReAlign Technology, the SUMMIT200 provides the most advanced 200 mm probe station platform for fast, high accuracy and high-volume measurements for existing and future devices and ICs.

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  • Introducing Velox 3.2 Probe Station Control Software

    Introducing Velox 3.2 Probe Station Control Software

    February 18, 2021

    The introduction of Velox 3.2 takes vision capabilities, usability and user guidance to the next level. 3 key features for Velox 3.2 deliver industry-leading benefits: a modernized Spectrum Vision, updated Autonomous RF Measurement Assistant and optimized SiPh-Tools for Silicon Photonics probing.

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2021

February 11, 2021

Autonomous RF Delivers Remote Probing from Anywhere | READ MORE

2020

September 3, 2020

New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE

June 26, 2020

Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE

May 28, 2020

Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None | READ MORE

May 5, 2020

Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE

April 23, 2020

Edge Coupling Efficiencies for Wafer and Die Level Applications | READ MORE

March 27, 2020

OptoVue Pro – Faster Time to Data with Real-Time In-Situ Calibration | READ MORE

February 20, 2020

Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE

January 23, 2020

Velox 3 Probe Station Control Software – Feature Videos | READ MORE

January 10, 2020

Enabling Unattended Test Over Multiple Temperatures by Automating Thermal Transitions and Probe-to-Pad Alignment | READ MORE

2019

November 1, 2019

Experience the All New Velox 3 Probe Station Control Software | READ MORE

October 24, 2019

New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE

October 10, 2019

DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE

September 19, 2019

Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE

August 23, 2019

VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE

August 8, 2019

CM300xi Probe System – Delivering Measurement Accuracy and Reliability | READ MORE

July 11, 2019

Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE