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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                Asset 4

                  Blog

                  Delivering Advanced mm-Wave Load-Pull Measurements

                  Delivering Advanced mm-Wave Load-Pull Measurements

                  March 23, 2021

                  FormFactor has partnered up with Focus Microwaves and Keysight Technologies to deliver a fully integrated solution for accurate on-wafer mm-Wave load-pull measurements, delivering a number of benefits along the way, including these four.

                  READ MORE
                  Autonomous RF Delivers Remote Probing from Anywhere

                  February 11, 2021

                  Autonomous RF Delivers Remote Probing from Anywhere

                  Autonomous RF Measurement Assistant allows customer to maximize their tool utilization while freeing key staff members up for other tasks and at the s...

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                  Testing VCSEL Devices On-Wafer

                  February 5, 2021

                  Testing VCSEL Devices On-Wafer

                  When it comes to testing VCSEL devices on wafer, however, there are multiple challenges. A major requirement is single and dual-sided testing – prob...

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                  Metrology Systems Division – FRT – Releases New MicroProf Videos

                  December 9, 2020

                  FRT Releases New MicroProf Metrology Videos

                  FRT – a FormFactor company, designs and delivers cutting edge metrology measurement systems and solutions for a number of different applications. Th...

                  READ MORE

                  2020

                  September 17, 2020

                  PureLine 3 Technology Eliminates 97% of Prober Environment Noise | READ MORE

                  September 3, 2020

                  New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE

                  July 16, 2020

                  Delivering Broadband S-parameter Measurement to 130GHz | READ MORE

                  July 10, 2020

                  Test Insights – 5G Production Test Considerations | READ MORE

                  July 6, 2020

                  Test Insights – Solving the Data Center Energy Crisis with Silicon Photonics | READ MORE

                  June 19, 2020

                  Hands On Applications Training for Usability, Throughput and Accuracy | READ MORE

                  May 21, 2020

                  New Thermal System with Reduced Air Consumption Delivers Best Cost-Performance | READ MORE

                  May 5, 2020

                  Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE

                  March 12, 2020

                  New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices | READ MORE

                  February 20, 2020

                  Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE

                  January 30, 2020

                  The PAC200 Probe Station for Cryogenic Probing Environments | READ MORE

                  2019

                  December 12, 2019

                  Genius Education Kits – Turnkey S-parameter Measurement Systems for RF and Microwave Test | READ MORE

                  October 10, 2019

                  DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE

                  September 19, 2019

                  Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE

                  July 11, 2019

                  Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE

                  April 25, 2019

                  4 Challenges When Testing Si and Advanced GaN/ SiC Devices On-Wafer | READ MORE

                  April 11, 2019

                  The MicroVac Chuck – Improving Yield and Test Accuracy for Thinned High-Power RF Devices | READ MORE

                  February 14, 2019

                  Exploring Terahertz Applications in Emerging Sciences | READ MORE

                  2018

                  November 1, 2018

                  Saluting the Semiconductor Geniuses | READ MORE

                  July 19, 2018

                  Wafer Prober: Characterization of MEMS Devices at Wafer-Level | READ MORE

                  January 11, 2018

                  Used Fab Equipment – Purchasing Options and Making Smart Decisions – Part 2 | READ MORE

                  January 5, 2018

                  Used Fab Equipment – Forces Driving Market Growth – Part 1 | READ MORE

                  2017

                  December 21, 2017

                  Three Requirements of Successful Electromigration Wafer-Level Testing | READ MORE

                  October 26, 2017

                  Wafer Prober: Characterization of MEMS Devices on Wafer-Level (Part Two) | READ MORE

                  August 24, 2017

                  FormFactor Earns Top VLSIresearch Honors | READ MORE

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