Blog
Probe Cards – Online Cleaning Frequency vs. Trade-Offs
June 7, 2019
Each time you abrasively clean a probe card, the abrasive may remove a small amount of probe tip material in addition to the contaminant. Your cleaning objective should be to determine a probing-to-cleaning ratio low enough to minimize probe tip wear, but high enough to maximize yield.
March 7, 2019
Validating IC Packaging Requirements for the Connected Car and IoT
As the connected car becomes more and more mainstream, future success continues to depend, in part, on the durability of the semiconductors and chips...
February 7, 2019
Four Pyramid Probe Card Cleaning Methods to Avoid
As you can imagine, there are cleaning methods to avoid that are actually common within the industry will damage Pyramid Probe Cards. These methods mu...
January 24, 2019
Pyramid Probe Cards – 3 Common Questions and Answers
Pyramid Probe® cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. We often get asked questions about...
2018
December 20, 2018
Addressing High Parallelism in Production RF Test | READ MORE
November 29, 2018
9 Steps to Determining Online Cleaning Parameters for Pyramid Probe Cards | READ MORE
October 11, 2018
Getting the Most from Pyramid Probe Cards: Training and Certifications | READ MORE
February 16, 2018
4 Key Benefits of the Katana-RF and Pyrana Probe Cards | READ MORE
February 8, 2018
3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning | READ MORE
January 25, 2018
Probe Card Cleaning 101 – Protecting Your Probe Card Investment | READ MORE