Blog
Addressing High Parallelism in Production RF Test
December 20, 2018
Traditionally, device manufacturers have deployed probe cards that support high frequency signals or mechanically robust multi-site probe cards. The ingredients needed to get to a mechanically robust, frequency-capable, multi-site probe card have been around for years, but there have been gaps.
November 29, 2018
9 Steps to Determining Online Cleaning Parameters for Pyramid Probe Cards
This post on cleaning Pyramid Probe Cards walks you through 9 steps to help you determine cleaning parameters – your cleaning interval, number of to...
October 11, 2018
Getting the Most from Pyramid Probe Cards: Training and Certifications
We offer a variety of options to enhance the life of your probe cards. From a thorough assessment of the operating environment with a report of recomm...
February 16, 2018
4 Key Benefits of the Katana-RF and Pyrana Probe Cards
The Pyrana and Katana RF probe cards deliver excellent signal integrity, low ground inductance and individually compliant contacts for RF devices up t...