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  • Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations

    Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations

    February 17, 2022

    With a wide range of applications, and upgrade paths to meet any future needs, and with ReAlign Technology, the SUMMIT200 provides the most advanced 200 mm probe station platform for fast, high accuracy and high-volume measurements for existing and future devices and ICs.

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  • Pyramid Probe Card Core

    3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning

    November 18, 2021

    Abrasive cleaning media can be divided into four categories: lapping films, abrasive loaded elastomers, coated foams, and soft-backed lapping films. Only the first three of these are recommended. Soft-backed lapping films should not be used.

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  • Expanding Large Area Arrays for Fine Pitch Vertical Probing

    Expanding Large Area Arrays for Fine Pitch Vertical Probing

    September 9, 2021

    Cameron Harker and Yohannes Desta, PhD, recently presented at the SWTest 2021 Conference. Their presentation – Challenges of Expanding Large Area Arrays for Fine Pitch Vertical Probe Cards – was awarded the Best Data Presentation of the Conference.

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2021

March 12, 2021

Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

2020

December 17, 2020

New MeasureOne Partnership Delivers Test Solutions for Power Semiconductor Devices | READ MORE

August 6, 2020

FormFactor Acquires Advantest Probe Card Assets | READ MORE

February 27, 2020

Introducing the Altius Vertical MEMS Probe Card for Advanced Packaging Technologies | READ MORE

2019

November 26, 2019

Delivering Zero-Defect IC Wafer Test for the Today’s Automotive Market Needs | READ MORE

June 7, 2019

Probe Cards – Online Cleaning Frequency vs. Trade-Offs | READ MORE

March 7, 2019

Validating IC Packaging Requirements for the Connected Car and IoT | READ MORE

February 7, 2019

Four Pyramid Probe Card Cleaning Methods to Avoid | READ MORE

January 24, 2019

Pyramid Probe Cards – 3 Common Questions and Answers | READ MORE

2018

December 20, 2018

Addressing High Parallelism in Production RF Test | READ MORE

November 29, 2018

9 Steps to Determining Online Cleaning Parameters for Pyramid Probe Cards | READ MORE

October 11, 2018

Getting the Most from Pyramid Probe Cards: Training and Certifications | READ MORE

February 16, 2018

4 Key Benefits of the Katana-RF and Pyrana Probe Cards | READ MORE

January 25, 2018

Probe Card Cleaning 101 – Protecting Your Probe Card Investment | READ MORE

2017

December 14, 2017

4 Features and 4 Benefits of Terminated TRE with the SmartMatrix 1500XP Probe Card | READ MORE

October 20, 2017

5 Ways SmartMatrix 1500XP Delivers Faster Time-to-Market for DRAM Memory Devices | READ MORE