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  • Amazing MEMS

    What is MEMS?

    January 12, 2024

    At the core of cutting-edge wafer probe cards lies the brilliance of MEMS, constituting approximately 75% of the global advanced probe card market. MEMS technology serves as the key to crafting probes with micron-level precision.

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  • Apollo Vertical Probe Cards for Cu Pillar Test

    Kepler and Apollo Probe Cards Meet the Challenges of Advanced AI

    May 4, 2023

    AI’s neural networks learn in much the same way as their biological counterparts, through example and repetition rather than the sequential logic of standard computer programming. They include massive concentrations of interconnected nodes, each representing the equivalent of a single neuron.

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  • HFTAP Series Probe Card

    The Need for Speed – Testing Ultra-Fast Memory

    April 14, 2023

    The HFTAP K32 probe card solution empowers customers to gain more intelligence at any stage of the heterogeneous integration process for advanced packages, where the traditional way to optimize yield on a monolithic silicon die is no longer adequate.

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2023

March 30, 2023

5G mmWave: Multi-site RF Probe Cards Enable Lower Cost-of-test in Mass Production | READ MORE

2022

December 8, 2022

Removing Probing Debris from Springs Used for DRAM and FLASH Applications | READ MORE

September 1, 2022

3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning | READ MORE

July 14, 2022

Test Vision Symposium Presentations Now Available | READ MORE

July 8, 2022

FormFactor Ranked the Number One Supplier of Semiconductor Probe Cards | READ MORE

May 5, 2022

Probe Card Cleaning 101 – Protecting Your Probe Card Investment | READ MORE

February 17, 2022

Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

2021

November 18, 2021

3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning | READ MORE

September 9, 2021

Expanding Large Area Arrays for Fine Pitch Vertical Probing | READ MORE

March 12, 2021

Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

2020

December 17, 2020

New MeasureOne Partnership Delivers Test Solutions for Power Semiconductor Devices | READ MORE

August 6, 2020

FormFactor Acquires Advantest Probe Card Assets | READ MORE

February 27, 2020

Introducing the Altius Vertical MEMS Probe Card for Advanced Packaging Technologies | READ MORE

2019

November 26, 2019

Delivering Zero-Defect IC Wafer Test for the Today’s Automotive Market Needs | READ MORE

June 7, 2019

Probe Cards – Online Cleaning Frequency vs. Trade-Offs | READ MORE

March 7, 2019

Validating IC Packaging Requirements for the Connected Car and IoT | READ MORE

February 7, 2019

Four Pyramid Probe Card Cleaning Methods to Avoid | READ MORE

January 24, 2019

Pyramid Probe Cards – 3 Common Questions and Answers | READ MORE

2018

December 20, 2018

Addressing High Parallelism in Production RF Test | READ MORE

November 29, 2018

9 Steps to Determining Online Cleaning Parameters for Pyramid Probe Cards | READ MORE

October 11, 2018

Getting the Most from Pyramid Probe Cards: Training and Certifications | READ MORE

January 25, 2018

Probe Card Cleaning 101 – Protecting Your Probe Card Investment | READ MORE

2017

December 14, 2017

4 Features and 4 Benefits of Terminated TRE with the SmartMatrix 1500XP Probe Card | READ MORE

October 20, 2017

5 Ways SmartMatrix 1500XP Delivers Faster Time-to-Market for DRAM Memory Devices | READ MORE