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  • Vertical Cavity Surface Emitting Laser – VCSEL Technology Takes Off!

    April 15, 2022

    VCSELs are semiconductor lasers in which the emitted light emerges perpendicular to the chip surface. A VCSEL is formed from a complex multilayer structure that is applied to the substrate by molecular beam epitaxy (MBE) or metal organic chemical vapor deposition (MOCVD).

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  • Understanding Wafer Applications in Surface Metrology

    March 25, 2022

    Microelectronic components and semiconductors are manufactured on round thin discs, so-called wafers. Wafers can be made of various conductive or non-conductive materials such as silicon, sapphire or glass with a typical diameter of 100, 150, 200 or 300 mm.

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  • MicroProf AP Metrology System

    Latest Podcast – Leading Edge Surface Metrology in Advanced Chip Manufacturing

    February 10, 2022

    Listen to how the FRT Metrology integration has changed FormFactor’s potential in the microchip industry. Gain insights from the founder of FRT Metrology and learn why hybrid metrology is a real game changer.

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October 21, 2021

Visit FormFactor FRT Metrology at SEMICON Europa | READ MORE

October 14, 2021

New Technical Brief: Automated Image Acquisition Process Ensures Flat Cell Culture Plates | READ MORE

July 12, 2021

Multi-Sensor Measurement – Protecting Against Package Counterfeiting | READ MORE

February 26, 2021

Hybrid Metrology – Reliable Measurement of Inaccessible Parameters | READ MORE