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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                    • INFINITY
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                Asset 4

                  Blog

                  Delivering Advanced mm-Wave Load-Pull Measurements

                  Delivering Advanced mm-Wave Load-Pull Measurements

                  March 23, 2021

                  FormFactor has partnered up with Focus Microwaves and Keysight Technologies to deliver a fully integrated solution for accurate on-wafer mm-Wave load-pull measurements, delivering a number of benefits along the way, including these four.

                  READ MORE
                  Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations

                  March 12, 2021

                  Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations

                  With a wide range of applications, and upgrade paths to meet any future needs, and now with ReAlign Technology, the SUMMIT200 provides the most advanc...

                  READ MORE
                  Automotive Chip Shortage Underscores the Need for Efficient Production Test

                  January 27, 2021

                  Automotive Chip Shortage Underscores the Need for Efficient Production Test

                  The current automotive SOC chip shortage is caused by a number of factors outside of production test but tackling the challenges here and improving ef...

                  READ MORE
                  New Webinar - Low Frequency Noise on December 8: Register Now

                  November 10, 2020

                  New Webinar – Low Frequency Noise on December 8: Register Now

                  We hope you’ll join FormFactor’s Peter Andrews – DC Market Segment Marketing, Systems Business Unit at FormFactor – and Arnaldo Sans – Appli...

                  READ MORE

                  2020

                  August 13, 2020

                  Best ATE Paper Award – 5G Wafer Test and the New Age of Parallelism | READ MORE

                  July 10, 2020

                  Test Insights – 5G Production Test Considerations | READ MORE

                  June 26, 2020

                  Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE

                  2019

                  November 22, 2019

                  New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications | READ MORE

                  October 24, 2019

                  New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE

                  June 14, 2019

                  Overcoming 3 Challenges with 5G Production-Level Test | READ MORE

                  May 3, 2019

                  Meeting the Challenges of 5G Production Test | READ MORE

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                  • Products
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                        • PM8/EPS200
                        • See All…
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                        • See All…
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                        • Back
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                          •  
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                        •  
                          •  
                          • Back
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                        • Trade-in/Buy Back
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                      •  
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                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
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                      • INFINITY
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                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
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                      • T-WAVE
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                      • RF MULTICONTACT
                        • InfinityQuad
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                        • Unity Probe
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                      • DC PARAMETRIC
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                        • WPH Probe
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                      • DC POWER
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                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
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                        • Probe Repair
                        • WinCal Support
                        • Back
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                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
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                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • [ RF Probing ]
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                        • 5G mmWave
                        • RF Transceivers
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                        • High Speed Digital
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                      • Advanced Packaging
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                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
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