Blog
Best ATE Paper Award – 5G Wafer Test and the New Age of Parallelism
August 13, 2020
Their paper explores the ins and outs of 5G and covers what probing technology you can use at these frequencies, what you need to think about for probe head inductance, and what Figures of Merit (FOM) are important for 5G probe cards.
July 10, 2020
Test Insights – 5G Production Test Considerations
Bringing 5G to market requires an array of supporting tools to ensure the end products meet expectations. It will require significant performance adva...
June 26, 2020
Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices
We are pleased to introduce the CM300xi-ULN 300mm wafer probing station designed for highly accurate low frequency flicker noise (1/f), random telegra...
November 22, 2019
New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications
A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to grea...