Test Insights – 5G Production Test Considerations
July 10, 2020
Bringing 5G to market requires an array of supporting tools to ensure the end products meet expectations. It will require significant performance advances in chip technology and manufacturing processes—all the while keeping price/performance at an economically viable level.
June 26, 2020
Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices
We are pleased to introduce the CM300xi-ULN 300mm wafer probing station designed for highly accurate low frequency flicker noise (1/f), random telegra...
November 22, 2019
New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications
A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to grea...
October 24, 2019
New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits
Focus Microwave’s Delta tuners are now integrated into our range of advanced characterization semi-automatic, and fully automatic probe stations. Th...