Blog
New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications
November 22, 2019
A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to greatly improve DC biasing accuracy, S-parameters measurement accuracy and post-calibration stability up to 110 GHz.
October 24, 2019
New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits
Focus Microwave’s Delta tuners are now integrated into our range of advanced characterization semi-automatic, and fully automatic probe stations. Th...
June 14, 2019
Overcoming 3 Challenges with 5G Production-Level Test
As 5G moves forward, we are fully committed to collaborating with leading manufacturers to develop innovative test and measurement approaches that wil...
May 3, 2019
Meeting the Challenges of 5G Production Test
With the significant increase in test content 5G brings, we are developing ways to provide fast, accurate measurements on 5G devices and accelerate ti...