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  • New RFA Arms and Storage Pods

    September 13, 2022

    This broadband dual probe solution is a collaboration among Keysight, Dominion Microprobe, VDI and Formfactor, and allows customer to characterize their 5G and early 6G devices and transistors with a single frequency sweep from 900 Hertz to 170 or 220 Gigahertz.

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  • New 170 GHz / 220 GHz Broadband Solution

    New 170 GHz / 220 GHz Broadband Solution

    May 31, 2022

    The joint offering, our new 220 GHz Broadband Solution, enables customers to address the needs of 5G and future 6G technologies that will have a significant impact on communications through the internet of things (IoT) and ubiquitous wireless connections.

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  • The Impact of NRZ versus PAM4 on Wafer Test

    The Impact of NRZ versus PAM4 on Wafer Test

    September 24, 2021

    The need for more complex digital processing is becoming greater than ever. This presentation shows some of the impacts of NRZ compared to PAM4 on wafer test through example probe cards and describes the changing test requirements.

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September 19, 2019

Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE

April 4, 2019

Improving Engineer Productivity with Infinity & InfinityXT Probes | READ MORE


October 25, 2018

Exploring The T-Wave Probe for THz Probing | READ MORE

September 6, 2018

Selecting the Right Engineering Probe for your Application Need | READ MORE

August 16, 2018

The Importance of Contact Performance for Accurate RF Measurement Results | READ MORE

April 19, 2018

Case Study: Challenges when Probing High Pad Count ICs and How FormFactor Overcomes These Challenges | READ MORE


August 10, 2017

Small Pad Probing: 5 Problems with Conventional Probes with Multiple Needles | READ MORE

August 3, 2017

Infinity Probes – Layout Events and Rules | READ MORE

July 20, 2017

Infinity Probes – Features that Affect Mechanical Layout | READ MORE