Achieve Error-Free Device Characterization with the DCP-X Probe
Precision for R&D and device engineers – Unlock unparalleled accuracy in your testing with MEMS technology
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Unlock Unmatched Precision with the DCP-X Probe
The DCP-X Probe is designed to meet the most demanding requirements of engineers and R&D teams. Whether you're testing cutting-edge semiconductor devices or characterizing high-frequency MEMS, the DCP-X Probe delivers unparalleled accuracy and long-lasting performance. Its precision, minimal tip damage, and robust MEMS technology make it the ideal choice for your testing needs.
Precision for Accuracy
Capture the most accurate electrical signals for both low- and high-frequency testing, ensuring that your results are both reliable and repeatable.
Ideal for CV, IV, and LFN testing.
Long-Lasting Durability
Built with advanced MEMS technology, the DCP-X Probe is engineered to last in the most rigorous testing environments, minimizing downtime and improving efficiency.
Perfect for high-volume testing.
Minimal Tip Damage
Designed to reduce wear and tear on probe tips, ensuring they remain in optimal condition even after extended use.
Less maintenance, more consistent results.
Get your custom quote with just a couple of details. We’ll reach out promptly to discuss how DCP-X can optimize your testing.