New FormFactor Wafer Probe Solution Reduces Time to Test
July 12, 2005
FormFactor NF150S Wafer Probe Card Offers Proven Device Test Technology Tailored to Growing NAND Flash Market Demand
Semicon West 2005 – July 12, 2005 – FormFactor, Inc. (Nasdaq: FORM) today announced full volume commercial production of the FormFactor NF150S wafer probe card for large-area arrays tailored to the growing NAND Flash market demand. A leading provider of advanced wafer probe cards, FormFactor has designed its latest product for reduced time to production, enabling customers to cut time to test and improve throughput using FormFactor’s proven technology.
Driven by consumer applications such as digital still cameras, 3G cell phones, MP3 players, and USB flash drives, semiconductor manufacturers are shifting production to NAND flash and serial flash and are moving test strategy to include wafer-level burn-in. The FormFactor NF150S wafer probe card extends FormFactor’s proprietary MicroSpring® contact technology to these manufacturers, providing them with familiar FormFactor wafer probe card benefits such as minimization of re-sort rates, increased parallelism and product uptime, as well as shorter lead times anticipated to reach just six weeks in 2006.
“NAND flash is driving demand for high-parallelism test capabilities,” said Joe Bronson, President, FormFactor. “The FormFactor NF150S reflects our ongoing commitment to innovation and delivering to our customers the test vehicles and solutions to reduce their overall cost of test. With the ramp of our new state-of-the-art manufacturing facility, we are in a position to support volume production and respond quickly to our customers’ demand.”