Cascade
T200
200 mm manual/ semi-automated on-wafer power device characterization system
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The Tesla T200 semi-automatic power device characterization system provides a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors up to 3,000 V (triax)/10,000 V (coax) and 200 A (pulsed)/10 A (DC)., while providing a low-noise, fully guarded and shielded test environment, as well as a certified safety interlock system integrated with an ergonomic clear enclosure or infrared laser light curtain.
Seamless Integration
- Convenient instrument connection kits
- Seamless integration between Velox and analyzers/measurement software
- Easy and safe system integration with Keysight and Keithley power device analyzers
MicroVac™ Chuck
- 495 Uniformly distributed vacuum micro-holes
- Gold-plated high power chuck surface
- Thin-wafer handling capability
- Low electrical and thermal contact resistance across the entire wafer, ensuring accurate measurement results and effective heat dissipation
- Prevents thin wafers from curling and breaking
Safety
- Regulatory-certified probing environment
- Safety interlock system with clear enclosure or light curtain
- Fully guarded and shielded test environment
- Operator safety during measurements
- Protects device and instrumentation from high voltage discharge
Ease of Use
- Roll-out stage
- Full wafer access and easy wafer loading/unloading
Velox Probe Station Control Software*
- User-centered design minimizes training costs and enhances efficiency
- Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
- Comprehensive alignment functions – from simple wafer alignment and mapping to advanced probe-to-pad alignment over multiple temperatures for autonomous semiconductor test
- Simplified operation for inexperienced users: Reduced training costs with Workflow Guide and condensed graphical user interface
- VeloxPro option: SEMI E95-compliant test executive software that enables simplified and safe automation of the entire wafer test cycle
*Semi-auto version only.
- High Power
TESLA - Power Device Characterization System
The Tesla semi-automatic power device characterization system provides a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors up to 3,000 V (triax)/10,000 V (coax) and 200 A (pulsed)/10 A (DC)., while providing a low-noise, fully guarded and shielded test environment, as well an infrared laser light curtain and safety interlock system.
SourceOne – Certified Pre-Owned Equipment
You want the best price-performance ratio for your wafer probe station? With our Certified Used Equipment we have an attractive option for you.
SourceOne – Factory Refurbishment Program
Extend the use of your probe station for up to another 15 years with our Factory Refurbishment Program.
SourceOne – Trade In / Buy Back Program
We'll take your probe station back for a credit note.
