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Cascade Probe Systems

We offer a complete line of premium performance analytical probe solutions for on-wafer probing, board test and package test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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              Asset 4
                EPS150TESLA
                Products Probe Systems Power Systems EPS150TESLA

                Cascade

                EPS150TESLA

                150 mm manual probe system for high-power device characterization

                OverviewKey FeaturesVideosDownloads

                EPS150TESLA Overview

                Energize Your Power Measurements

                High-voltage probing solution to test breakdown voltages up to 3,000 volts, and high-current probing up to 40 amps for lowest on-state resistance. A shielded environment reduces noise and provides safe operating conditions.

                Applications: High Power

                EPS150TESLA Key Features

                Optimized Measurement Setup

                • Multi-purpose SIGMA instrument integration kit
                • Shorter cabling and universal chuck connection
                • Triax probe with protected guard
                • Optimized signal path
                • Safe probe tip exchange
                • Seamless integration of various analyzers

                High Power Chuck

                • Triax design for low-leakage measurements up to 3 kV
                • Special chuck surface coating
                • High-isolation ready
                • High-current measurement up to 100 A with lowest contact resistance
                • Optional upgrade for 10 kV (coax) operating voltage
                • Thin wafer handling capability

                Safe Operation

                • Arcing protection
                • Shield Enclosure with interlock
                • Advanced grounding concept
                • Maximum protection from high-voltage shock for users and devices
                • Common ground protection for all instruments
                • EMI/light-tight shielded environment

                Videos

                Downloads

                Icon - EPS150TESLA Product Flyer
                Icon - EPS150TESLA Data Sheet
                Icon - EPS150TESLA Facility Planning Guide
                Icon - 150 mm Product Line Overview
                Icon - Educational Savings Program
                Icon - Cascade Probe Systems Brochure
                Icon - Probe Station Accessory Catalog

                 

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                • Products
                  • Probe Systems
                    • 150 MM Probe Systems
                      • MPS150/EPS150
                      • Back
                    • 200 MM Probe Systems
                      • PM8/EPS200
                      • PA200
                      • BlueRay
                      • Summit
                      • See All…
                      • Back
                    • 300 MM Probe Systems
                      • PM300
                      • CM300
                      • See All…
                      • Back
                    • Board Level Systems
                      • Board Test Systems
                      • Back
                    • Reliability Test Systems
                      • Estrada
                      • Symphony
                      • 1164
                      • Application Modules
                      • See All…
                      • Back
                    • Power Systems
                      • Tesla
                      • Back
                    • Advanced Test
                      • Vacuum/Cryo/Pressure Systems
                      • Back
                    • Software
                      • Velox
                      • WinCal XE
                      • Back
                    • Accessories
                      • eVue Microscope
                      • Positioners
                      • Chucks
                      • Vibration Isolation Tables
                      • ShieldEnclosure™
                      • Pressure Probe Module
                      • Back
                    • Additional Products/Programs
                      • Custom Probe Systems
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Educational Savings
                      • Back
                    • Back
                  • Probes
                    • ACP
                      • ACP Probe – Coaxial
                      • ACP Probe – Cryo/Vacuum
                      • ACP Resistive Matching Probe
                      • Back
                    • INFINITY
                      • Infinity Probe – Coaxial
                      • Infinity Waveguide Probe
                      • Back
                    • |Z| PROBE
                      • |Z| Probe – Coaxial
                      • |Z| Probe® PCB
                      • |Z| Probe® Power
                      • Back
                    • T-WAVE
                      • T-Wave Probe
                      • Back
                    • RF MULTICONTACT
                      • InfinityQuad
                      • ACP-Q Probe
                      • Unity Probe
                      • Multi-|Z| Probe
                      • |Z| ProbeWedge
                      • QuadCard™
                      • Back
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                      • Back
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                      • Back
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                      • Back
                    • SPECIALTY
                      • Light Wave Probe
                      • Back
                    • SIGNAL INTEGRITY
                      • FPC Probe
                      • Back
                    • CALIBRATION TOOLS
                      • Impedance Standard Substrates
                      • CSR Cal Substrates
                      • Multiline TRL Cal Substrates
                      • WinCal XE
                      • Back
                    • Back
                  • Probe Cards
                    • DRAM
                      • PH Series
                      • SmartMatrix
                      • Back
                    • FLASH
                      • TouchMatrix
                      • Back
                    • FOUNDRY & LOGIC
                      • Altius
                      • Katana
                      • QiLin
                      • Cantilever
                      • Apollo
                      • TrueScale
                      • Vx-MP
                      • Back
                    • PARAMETRIC
                      • Pyramid Parametric
                      • Takumi
                      • Back
                    • RF / MMW / RADAR
                      • Katana-RF
                      • Pyrana
                      • Pyramid Accel Test Fixture
                      • Pyramid-MW
                      • Pyramid RF P-Series
                      • Back
                    • CALIBRATION TOOLS
                      • Pyramid Calibration Substrate
                      • Back
                    • Back
                  • Back
                • Test Expertise
                  • Customer Collaboration
                    • Accelerate Profitability
                    • Lab to Fab
                    • Back
                  • Applications
                    • High Bandwith Memory
                    • Silicon Photonics
                    • Back
                  • Publications
                    • Technical Papers
                    • Back
                  • MeasureOne Solutions
                    • MeasureOne Program Overview
                    • 1/f Device Characterization
                    • Circuit Characterization
                    • Cryogenic / Magnetic Probing
                    • S-Parameter & DC Parametric
                    • Terahertz Probing
                    • Back
                  • Back
                • Company
                  • About Us
                    • Company Profile
                    • Our History
                    • Leadership
                    • Board of Directors
                    • Corporate Citizenship
                    • Global Locations
                    • Back
                  • Investors
                    • Investor Relations
                    • Back
                  • News & Events
                    • Newsroom
                    • Upcoming Events
                    • Blog
                    • Back
                  • Careers
                    • Career Opportunities
                    • Benefits
                    • Employment Practices
                    • Back
                  • Back
                • Sales & Service
                  • Contact Us
                    • Global Locations
                    • Contact Sales
                    • Parts & Service Request
                    • Back
                  • Additional Products/Programs
                    • Equipment Financing
                    • Educational Savings
                    • Certified Used Equipment
                    • Trade-in/Buy Back
                    • Back
                  • Product Support
                    • FormFactor RMA
                    • Cascade RMA
                    • Analytical Probe Repair
                    • WinCal User Feedback
                    • WinCal Demo
                    • Pyramid Training and Certification
                    • Back
                  • Portal Sign In
                    • Sales Portal
                    • Service Portal
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