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PAC200 200 mm Semi-automated Cryogenic Probe Station
  • PAC200 200 mm Semi-automated Cryogenic Probe Station
  • 200 mm Vacuum / Cryogenic Probe Station - Ergonomic Front Side Loading
  • 200 mm Cryogenic Manual Probe Station - Probes Inside the Chamber
  • Different Microscope Options for Vacuum/Cryogenic Probing

Semi-automated cryogenic wafer probing < 20 K

The PAC200 is a highly-precise semi-automated probe station for wafers and substrates up to 200 mm in a high vacuum environment, at cryogenic temperatures down to 77 K with liquid nitrogen or < 20 K with liquid helium. Designed for industrial environments and major research facilities, it supports a wide range of applications, including DC and RF measurements of the latest silicon, compound semiconductor and superconductor devices, MEMS and optoelectronic tests.

The PAC200 supports multiple optical instruments like IR radiation sources (black bodies). Up to eight probe positioners and/or a probe card can be integrated.

200 mm Cryogenic Manual Probe Station - Probes Inside the Chamber

Flexibility

  • Different substrate carriers for wafers up to 200 mm or single dies
  • Probe cards and/or up to eight positioners
  • Use with liquid nitrogen or helium, depending on the target temperature
  • Accessories available, such as black bodies and optical motion analysis tools
  • Optional upgrade for 300 mm wafer
  • Designed for industrial environments
  • Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
  • Ideal for small structures

Ice- and Condensation-Free Probing Below 7K for Cryogenic Tests

Stability

  • Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
  • Probe positioners placed inside vacuum chamber
  • Short and stable probe arms
  • Solid station frame with built-in vibration-isolation
  • Optional microscope bridge
  • Precise probe positioning
  • Excellent measurement accuracy and repeatability
  • Superior vibration attenuation
  • Stable image quality for high-resolution microscopes

Front Loading Capability for Vacuum / Cryogenic Probing

Ease of Use

  • Joystick controller
  • Manual probe positioners with rotary feed-throughs
  • Front loading capability through load door
  • Comfortable and easy operation
  • Quick and ergonomic change of DUT

Velox Probe Station Control Software

Velox Probe Station Control Software

  • User-centered design minimizes training costs and enhances efficiency
  • Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays
  • Simplified operation for inexperienced users: Reduced training costs with Workflow Guide and condensed graphical user interface
  • VeloxPro option: SEMI E95-compliant test executive software that enables simplified and safe automation of the entire wafer test cycle

  • IV/CV
  • MEMS
  • Opto
  • RF/mmW/THz
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PAC200 Fully-Automated Cryogenic Probe Station with Loader

The PAC200 cryogenic probe station with loader enables fully-automated wafer handling in a cryogenic environment. This reduces cool-down and warm-up time, increases throughput and lowers liquid nitrogen consumption. Carriers with up to three wafer fragments and/or wafers can be prepared independent from the test cycle at cryogenic temperatures.

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SourceOne – Certified Pre-Owned Equipment

You want the best price-performance ratio for your wafer probe station? With our Certified Used Equipment we have an attractive option for you.

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SourceOne – Factory Refurbishment Program

Extend the use of your probe station for up to another 15 years with our Factory Refurbishment Program.

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SourceOne – Trade In / Buy Back Program

We'll take your probe station back for a credit note.