The specification of a test system to perform wafer-level measurements on circuits such as amplifiers, mixers and filters can be challenging, especially when a single wafer can include multiple circuit types. The tests required to validate these structures are wide-ranging and complex, including S-parameters, DC-parameters, noise figure, gain compression and intermodulation distortion. Measurement and calibration accuracy is critical, especially where testing must be correlated between multiple locations.
MeasureOne Benefits Include
- Best-of-breed, high-performance tools from industry leaders FormFactor and Keysight Technologies
- Configured and optimized to deliver accurate, repeatable, and automated on-wafer circuit characterization measurements
Solution Components Include
- Cascade 200 mm or 300 mm semi-automated probe system, WinCal XE calibration software, Infinity Probes, and ISS calibration standards
- Keysight Technologies PNA or PNA-X, B1500A, WaferPro-XP, IC-CAP software, and DC Power Analyzer