Circuit Characterization
The specification of a test system to perform wafer-level measurements on circuits such as amplifiers, mixers and filters can be challenging, especially when a single wafer can include multiple circuit types. The tests required to validate these structures are wide-ranging and complex, including S-parameters, DC-parameters, noise figure, gain compression and intermodulation distortion. Measurement and calibration accuracy is critical, especially where testing must be correlated between multiple locations
MeasureOne Benefits
- Guaranteed system configuration, installation and support
- Accurate and repeatable circuit characterization
- System configuration pre-validated
- Installation to defined acceptance criteria
- Single point of contact for support
- Solutions experts for optimization
Solution Components
- Cascade Microtech 200 mm or 300 mm semi-automated probe system, WinCal XE calibration software, Infinity Probes, and ISS calibration standards
- Keysight Technologies PNA or PNA-X, B1500A, WaferPro-XP, IC-CAP software, and DC Power Analyzer