Press Kit: Contact Intelligence
Global technology trends, such as the move to 5G, are creating a growing demand for new generations of ICs that are faster, more energy efficient, and able to operate in environments all the way from outer space to the engine compartments in self-driving vehicles.
Given this relentless advance in technology, wafer-level test has become increasingly complex and time-consuming in response. Large volumes of data must be extracted under diverse conditions to guarantee performance, validate fab processes, and measure life cycles, among other requirements.
At the same time, market pressures make no allowance for extra time to be spent, either in the lab or the fab, on wafer-level testing. Engineers and scientists need to find ways to leverage scarce human resources to keep pace. The solution has come in the form of ForrmFactor’s Contact Intelligence, innovative hardware and software in our advanced wafer probe stations that accelerates the testing cycle in the engineering lab—with no loss in measurement accuracy.
With FormFactor’s Contact Intelligence, the operator can start a test and leave the system measuring during the whole shift, overnight or even over the weekend, without any user intervention. Probes are dynamically corrected for the most accurate pad placement on-the-ﬂy to compensate for any thermal expansion of the probes or device when changing temperature. Contact…Read More
Perform True Autonomous RF and mm-Wave Measurements and Calibrations on 200mm and 300mm Probe Stations FormFactor introduces a new assistant for autonomous calibration and measurement of RF devices over multiple temperatures. New RF devices for applications such as 5G, autonomous driving and next generation Wi-Fi, need to have the most accurate device models for their…Read More