FormFactor Introduces New Parametric Test Solution
October 26, 2005
FormFactor TakumiTM Interchangeable Wafer Probe Card Family Further Extends Proven Technology into the Front-End Manufacturing Process
LIVERMORE, Calif. – Oct. 26, 2005 – FormFactor, Inc. (Nasdaq: FORM), a leading provider of advanced wafer probe cards, today announced its new TakumiTM wafer probe solution. FormFactor’s Takumi products utilize interchangeable wafer probe card architecture for in-line process, reliability, and end-of-line parametric testing. Parametric testing monitors processes, rather than devices in semiconductor fabs. The Takumi wafer probe solution extends FormFactor’s wafer probe card design expertise and advanced technology farther into the front end of the semiconductor manufacturing process.
The relentless demand for consumer electronics products with additional functions in smaller sizes is driving semiconductor manufacturers to fabricate smaller semiconductor devices at shrinking process nodes. These smaller geometries can generate new types of electrical device flaws during the fabrication process. Shrinking process nodes increase the need for in-process, electrically precise testing prior to the traditional functional testing of chips. The FormFactor Takumi wafer probe solution helps manufacturers address these evolving fabrication and test requirements.
Designed for superior parametric test performance, the Takumi wafer probe solution gives semiconductor manufacturers better and faster insight into opportunities to validate their designs, verify process performance and achieve higher product yields. The proprietary interchangeable architecture allows manufacturers to rapidly switch FormFactor probe heads with minimal production downtime. With this addition, the FormFactor family of products now addresses the entire wafer test and parameter validation process, from fabrication to wafer-level final test.
Inotera Memories Inc., a joint venture of Nanya Technology Corporation and Infineon Technologies AG, is using FormFactor Takumi Interchangeable technology in the manufacture of dynamic random access memory (DRAM) products. “FormFactor’s new parametric Takumi Interchangeable technology has been a boon to Inotera’s high-volume production environment,” said Cindy Chen, WAT (Wafer Assembly and Test) & Device Dept., WAT Section, Inotera Memories, Inc. “With much more consistent, highly accurate testing throughout production, we are able to address problems that ultimately impact device yield at the earliest stage. We are able to upgrade interchangeable probe heads, or Inserts, without any downtime on the production floor, and because the Insert lasts more than six times longer than others we’ve used, our cost of test continues to drop – while yield has gone up.”
The FormFactor Takumi Interchangeable product line incorporates the Company’s MicroSpring® contact technology — the advanced, proprietary technology that has transformed wafer-level final test — introducing superior thermal stability, probe positioning accuracy, precision electrical measurement and long test device lifetime into the parametric test environment. In contrast to conventional probe devices, the Takumi wafer probe solution enables outstanding thermal stability that supports probing from -40 C to 150 C without loss of production time, while extremely accurate and stable electrical measurement affords better, faster insight into semiconductor performance. Precision probe pad placement leads to greater test accuracy even on a 30umx30um parametric test pad, and proven FormFactor MicroSpring® interconnect technology minimizes potential contact damage and particle generation.
“The FormFactor Takumi interchangeable product line, which was developed by our Japan organization, extends the benefits of our industry-leading probing technology into front-end manufacturing. Enabling the parametric test roadmap of our customers, FormFactor delivers breakthrough test performance and cost-savings throughout the semiconductor manufacturing process,” said Joe Bronson, president, FormFactor. “This new wafer probe solution will open new markets and new customers to FormFactor. It is the latest milestone in our strategy to offer innovative, comprehensive test solutions from fabrication to wafer-level final test.”