Cascade
Summit
200 mm manual probe system
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Precise On-Wafer Device and Process Characterization
High-precision probe system that enables testing at multiple temperatures. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C.
High flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
Advanced shielding solution
- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
- Advanced EMI-shielding with PureLine with AttoGuard technologies
- Best solution for low-noise and 1/f measurements
- Minimize AC and spectral noise
- Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
Ease of use
- Locking roll-out stage
- Innovative microscope remote control
- Intuitive ergonomic stage controls
- Quick, safe, and comfortable wafer access
- Easy on-wafer navigation
- Fast setup and test data gathering
Velox Probe Station Control Software*
- Dedicated Velox version for manual probe stations
- AugmentedAlign tool with on screen markers for improved RF measurement accuracy
- Failure Analysis
- IV/CV
- MEMS
- Reliability
- RF/mmW/THz
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FormFactor RF Market Director Anthony Lord reviews the challenges of making very high frequency measurements over a broad band, especially at millimeter waves. He discusses the need for device modelling and circuit characterization with high accuracy and repeatability, as well as the challenges of making these measurements over temperature (-40 to as high as +175 degrees C).
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Focus Microwave’s new low frequency DELTA tuners have been seamlessly integrated onto FormFactor’s CM300xi automated wafer probe station. The solution provides high VSWR fundamental and harmonic tuning and covers a wide frequency range of 1.8 to 40 GHz.
Turnkey Solution for Load-Pull Modeling and Characterization of 5G Devices and Transistor Circuits
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