PLC50-dry
Dry-cooled 100 mm manual cryogenic probe system
Dry-cooled 100 mm manual cryogenic probe system
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Subscribe to Our NewsletterEntry-Level Manual Cryogenic Wafer Probing Below 6 K
The PLC50-dry is a highly precise and cost-effective probe station for wafers and substrates up to 100 mm, operating in a high-vacuum environment. It enables ultra-low temperature measurements below 6 K — without the need for liquid cryogens. Instead, the system relies solely on an integrated cryocooler, offering fully cryogen-free operation.
Engineered to meet the demanding needs of modern laboratories, the PLC50-dry supports a wide range of applications, including DC and RF measurements of advanced silicon, compound semiconductor, and superconductor devices, as well as IR sensors, MEMS and optoelectronic testing like silicon photonics.
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