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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

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          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                Asset 4
                  |Z| Probe - CSR Cal Substrates
                  Products Probes Calibration Tools CSR Cal Substrates

                  Cascade

                  CSR Cal Substrates

                  Perfectly matched to the |Z| Probe®

                  OverviewDownloads

                  CSR Cal Substrates Overview

                  The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

                  All CSR calibration substrates include the Open standard on the substrate itself, providing a more accurate calibration when compared to simply lifting the probes for Open. Since our probe systems are used in the laser-trimming process, the typical accuracy is better than 0.1% for all Load standards. Also, the resistance of the Load standard remains stable within 0.3% of the ideal value (50 Ω), over a temperature range from 10 to 430 K.

                  Finally, the design of the Line standard is optimized, resulting in accuracy of the characteristic impedance within 1.0% of the ideal value (50 Ω) for frequencies up to 110 GHz and beyond. For these reasons, the CSR family guarantees the best calibration, and thus the most accurate measurements.

                  Applications:

                  Downloads

                  Icon Probe Selection Guide

                  Calibration Standard

                  Part Number Description Pitch (µm) PDF
                  41702 |Z| Probe, CSR-4, GSG 250 to 500
                  CSR-4
                  41704 |Z| Probe, CSR-5, GS/SG 250 to 500
                  CSR-5
                  56407 |Z| Probe, CSR-6, GS/SG 50 to 250
                  CSR-6
                  62025 |Z| Probe, CSR-8, GSG 100 to 250
                  CSR-8
                  73319 |Z| Probe, CSR-9, GSG 50 to 150
                  CSR-9
                  62563 |Z| Probe, CSR-15, GSG 500 to 1250
                  CSR-15
                  69061 |Z| Probe, CSR-16, GS/SG 500 to 1250
                  CSR-16
                  71391 |Z| Probe, CSR-17, GSG 1000 to 2500
                  67074 |Z| Probe, CSR-18, GS/SG 1000 to 2500
                  51077 |Z| Probe, CSR-30, GSGSG 100
                  CSR-30
                  51078 |Z| Probe, CSR-31, GSGSG 150
                  CSR-31
                  51079 |Z| Probe, CSR-32, GSGSG 200
                  CSR-32
                  51080 |Z| Probe, CSR-33, GSGSG 250
                  CSR-33
                  51081 |Z| Probe, CSR-34, GSGSG 500
                  CSR-34
                  51082 |Z| Probe, CSR-35, GSGSG 125
                  CSR-35
                  51874 |Z| Probe, CSR-41, GSSG 125 to 150
                  CSR-41
                  51875 |Z| Probe, CSR-43, GSSG 200 to 250
                  CSR-43
                  51876 |Z| Probe, CSR-44, GSSG 400 to 600
                  CSR-44
                  52379 |Z| Probe, CSR-40, GSSG 100
                  CSR-40
                  53527 |Z| Probe, CSR-50, SGS 100
                  CSR-50
                  53528 |Z| Probe, CSR-51, SGS 125 to 150
                  CSR-51
                  53529 |Z| Probe, CSR-53, SGS 200 to 250
                  CSR-53
                  53530 |Z| Probe, CSR-54, SGS 400 to 500
                  CSR-54
                  71392 |Z| Probe, CSR-101, GSG/GS/SG 100 to 300
                  CSR-101
                  136643 |Z| Probe, Calibration substrate in a silicon wafer

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