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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
DRAM
The latest DRAM chips deliver extremely fast and smooth graphic and cache memory response in game consoles and personal computers, as well as server applications. They afford soaring memory capacity in smaller and smaller cellular phones, IOT and other consumer electronics, as semiconductors get stacked into compact packages of multi-tasking die. Testing these new, high-performance, high-density DRAM devices is optimized with FormFactor’s Matrix and PH-Series wafer probe cards as they improve efficiency and reduce the overall cost of DRAM test.
Parametric
Takumi™ probe cards for in-line and end-of-line parametric testing give IC manufacturers earlier insight into opportunities to validate their designs, verify process performance and achieve higher yields. High contact precision supports manufacturers’ use of smaller test pads and narrower scribe lines on their product wafers.
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