150 mm Systems
The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm. Pre-configured application-focused probing solutions are available with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The MPS150 is the industry’s probe platform of choice.
Reliability Test Systems
Cascade reliability test systems grow with your needs. Whether you start with the Symphony test system for small WLR applications or the 1164 test system for large PLR or WLR applications - the modular, scalable design allows easy expansion in the future
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
For MEMS devices that require test in a high vacuum or controlled pressure environment, and for IR imaging devices or cutting edge technologies that require testing at cryogenic temperatures, our special vacuum, pressure and cryogenic probe stations enable precise on-wafer measurements in extreme environments.
Custom Probe Systems
Customized solutions for a variety of challenging applications