150 mm Systems
Easy – flexible – future proof: Customize your 150 mm manual probe station with application-specific starter kits at an incredible price starting at $13,880.
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
For MEMS devices that require test in a high vacuum or controlled pressure environment, and for IR imaging devices or cutting edge technologies that require testing at cryogenic temperatures, our special vacuum, pressure and cryogenic probe stations enable precise on-wafer measurements in extreme environments.
Custom Probe Systems
Customized solutions for a variety of challenging applications