300 mm Systems
Cascade 300 mm probe stations set the standard for manual and automated on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
Custom Probe Systems
Customized solutions for a variety of challenging applications