300 mm Systems
Cascade 300 mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
Reliability Test Systems
Cascade reliability test systems grow with your needs. Whether you start with the Symphony test system for small WLR applications or the 1164 test system for large PLR or WLR applications - the modular, scalable design allows easy expansion in the future
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
Custom Probe Systems
Customized solutions for a variety of challenging applications