Single Sweep Broadband S-Parameter measurements for Semiconductor Transistor and IC Test to 220 GHz

With the growing demand for consumer devices working in the mm-wave range, including 5G/6G  and automotive radar, there is a growing need to enable measurements to go all the way to 220 GHz in a single sweep. Traditionally, measurements beyond conventional coaxial frequency limits often requires more than 1 measurement to cover the broader frequency range of interest, demanding the performance levels that are equivalent to conventional coaxial approaches. In this webinar we will present a new optimized single sweep solution for S-parameters measurements from 900 Hz to 220 GHz. We will also discuss recent developments of RF probes, instrumentation, calibration standards, and techniques that allow easy, accurate, repeatable, and trustworthy data.