FormFactor Extends Capabilities of SmartMatrix™ Probe Card to Deliver Single-Touchdown, 1500-site Parallelism at 200 MHz Wafer Test Speeds
September 19, 2017
FormFactor, Inc. (NASDAQ:FORM), an industry-leading electrical test and measurement supplier to the semiconductor industry, announced the release of the SmartMatrix 1500XP probe card to reduce cost of test for the latest DRAM devices.
SmartMatrix 1500XP provides 300 mm wafer testing for advanced DRAM
LIVERMORE, Calif., Sept. 19, 2017 (GLOBE NEWSWIRE) — FormFactor, Inc. (NASDAQ:FORM), an industry-leading electrical test and measurement supplier to the semiconductor industry, announced the release of the SmartMatrix 1500XP probe card to reduce cost of test for the latest DRAM devices. As the industry transitions to sub-20 nanometer design rules to increase die per wafer and bit density, SmartMatrix 1500XP enables testing of 25 percent more die simultaneously in a single touchdown, while increasing wafer test speeds to 200 MHz. The robust Matrix™ architecture and FormFactor’s MEMS capability, combined with proprietary advanced tester resource enhancement (ATRE) technology, make SmartMatrix 1500XP a proven solution for reducing cost of test.
According to IC Insights, DRAM bit volume is expected to increase by 30 percent this year from already historically strong levels, with DRAM content growth continuing in cost-sensitive mobile and data center applications. In addition, the extreme technical and quality requirements of rapidly-growing automotive applications bring unique challenges to wafer probing, demanding test temperatures as low as -40C and as high as 160C. Building on the proven Matrix architecture, FormFactor addresses both cost and technical challenges with the new SmartMatrix 1500XP advanced memory probe card.
Key features include:
- Advanced tester resource enhancement (ATRE) technology, enabling customers to test up to 1500 die in parallel for the lowest test cost.
- Superior thermal agility with reduced soak times and improved scrub performance, providing optimal operational efficiency from a single probe card that can be used over a broad temperature range.
- 3-D MEMS MicroSpring technology with excellent contact stability at low force, enabling probe counts over 100,000.
- Test clock rates up to 200 MHz at wafer sort, enabling customers to significantly increase throughput and test coverage without increasing test times.
“The combination of performance and cost-of-test improvements provided by SmartMatrix 1500XP enable DRAM manufacturers to reduce costs during increasingly steep product ramps at 20 nm and below,” said Mike Slessor, President and CEO of FormFactor. “As we continue to innovate and extend the capabilities of the proven Matrix platform for DRAM wafer sort, we remain very focused on partnering with our customers to advance their yield knowledge and accelerate their profitability.”
FormFactor, Inc. (NASDAQ:FORM), is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design debug, to qualification and production test. Semiconductor companies rely upon FormFactor’s products and services to accelerate profitability by optimizing device performance and advancing yield knowledge. The Company serves customers through its network of facilities in Asia, Europe, and North America. For more information, visit the Company’s website at www.formfactor.com.
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