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Cascade Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

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          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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                Asset 4
                  Company Press Releases May 29, 2020

                  Press Releases

                  New SmartMatrix™ 3000XP Probe Card Lowers DRAM Test Costs by More than 25%

                  May 29, 2020

                  SmartMatrix 3000XP provides 300 mm wafer testing for up to 3000 die simultaneously

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                  SmartMatrix 3000XP provides 300 mm wafer testing for up to 3000 die simultaneously

                  LIVERMORE, CA – (Globe Newswire – May 29, 2020) – FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe card, reaching another high-throughput milestone in DRAM wafer test . The new SmartMatrix 3000XP probe card allows DRAM manufacturers to test 3000 die or more in a single touchdown leveraging FormFactor’s proprietary Tester Resource Enhancement (ATRE) and MEMS probe technologies. The new breakthrough allows the simultaneous test of approximately 1000 additional die over previous capabilities and can reduce the test cost per die by more than 25%.

                  The DRAM industry’s migration to the 1Z and 1α nanometer process node from the previous 1X and 1Y nodes continues the trend to increased die count on wafer. As a result, full-wafer DRAM probe cards that simultaneously test every die on the wafer must keep pace. Built on FormFactor’s proven and scalable DRAM probe-card architecture, the SmartMatrix 3000XP incorporates new custom electronics to enhance signal integrity while leveraging massive tester resource sharing to enable highly parallel test at the 1Z and 1α nanometer nodes. According to market research firm IC Insights, the 1Z DRAM node will move to high volume production late this year.

                  “The technology built into our advanced DRAM probe cards provides customers a way to keep test costs in check, increase throughput of a test cell, and ramp to high volume production quickly,” said Matt Losey, Senior VP and GM of the Probes Business Unit at FormFactor. “The SmartMatrix probe card, with its scalable MEMS probe technology, helps accelerate our customers’ yield and performance knowledge while meeting their aggressive die shrink roadmap.”

                  The SmartMatrix 3000XP probe card’s key features include:

                  • Proprietary TTRE (Terminated Tester Resource Enhancement) technology, enabling parallel test of 3000 die for low test cost
                  • Ultra-high switch-density ATRE (Advanced Tester Resource Enhancement) components allowing efficient component placement on existing 520mm PCB tester platforms
                  • Industry-leading test temperature range, from -40C to 125C, with a single probe card design for optimal operational efficiency
                  • Proven low-force 3D MEMS probe technology, enabling more than 150,000 probes per card at 1Z and 1α tech nodes pitch requirements. The platform supports the next generation 3D MEMS probe technology for ultra-small DRAM die
                  • Test clock rates up to 200 MHz at wafer sort, significantly increasing throughput and test coverage without compromise on test times

                  To request more information about SmartMatrix, visit www.formfactor.com/contact-sales.

                  About FormFactor
                  FormFactor, Inc. (NASDAQ:FORM), is a leading provider of essential test and measurement technologies along the full IC life cycle – from metrology and inspection, characterization, modeling, reliability, and design debug, to qualification and production test. Semiconductor companies rely upon FormFactor’s products and services to accelerate profitability by optimizing device performance and advancing yield knowledge. The Company serves customers through its network of facilities in Asia, Europe, and North America. For more information, visit the Company’s website at www.formfactor.com.

                  Caution Regarding Forward-looking Statements:

                  This press release contains forward-looking statements within the meaning of the “safe harbor” provisions of the federal securities laws, including with respect to the Company’s future financial and operating results, the Company’s plans, strategies and objectives for future operations. These statements are based on management’s current expectations and beliefs as of the date hereof, and are subject to a number of risks and uncertainties, many of which are beyond the Company’s control, that could cause actual results to differ materially from those described in the forward-looking statements. These forward-looking statements include, but are not limited to statements regarding customer demand, conditions in the semiconductor industry, and other statements regarding the Company’s business. The following factors, among others, could cause actual results to differ materially from those described in the forward-looking statements: changes in demand for the Company’s products; customer-specific demand; the speed of customer implementation of new technologies; and other factors, including those set forth in the Company’s most current annual report on Form 10-K, quarterly reports on Form 10-Q and other filings by the Company with the U.S. Securities and Exchange Commission.

                  Trade Contact
                  David Viera
                  Corporate Communications
                  (925) 290-4182
                  david.viera@formfactor.com

                  Investor Contact
                  Stan Finkelstein
                  Investor Relations
                  (925) 290-4321
                  ir@formfactor.com

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