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Autonomous High-Power (Auto HP) Measurement Assistant
  • Autonomous High-Power (Auto HP) Measurement Assistant
  • Autonomous High-Power (Auto HP) Measurement Assistant
  • Autonomous High-Power (Auto HP) Measurement Assistant
  • Autonomous High-Power (Auto HP) Measurement Assistant
  • Autonomous High-Power (Auto HP) Measurement Assistant

The Autonomous High-Power Measurement Assistant from FormFactor delivers hands-free, 24/7 test automation for power semiconductor devices—even under extreme thermal and electrical conditions. Designed for SiC, GaN, and high-power silicon devices, Autonomous High-Power enables fast, accurate, and repeatable over-temperature measurements across single and multi-DUT layouts.

With FormFactor’s Contact Intelligence, operators can start a test and leave the probe station running unattended throughout shifts, overnight, or even over weekends. Contact Intelligence provides fully autonomous probe touchdown control, real-time alignment corrections, and optimized contact resistance during thermal transitions—ensuring reliable data with minimal operator intervention.

Autonomous High-Power integrates submicron-accuracy motorized hogh-power positioners, high-performance ultra-high-current and high-voltage probes, and an exclusive TopHat with FlexShield™ to maintain stability from -55°C to +250°C. Dynamic touchdown control and automatic probe cleaning enable the system to adapt intelligently to changing test conditions, optimizing probe lifespan and measurement quality.

Test sequence complexity is greatly reduced with VueTrack™ software and a high-resolution microscope that automate probe adjustments, layout changes, and alignment corrections—even during thermal transitions. Operators simply define the test sequence, and Autonomous High-Power manages the rest—maximizing throughput while minimizing manual steps.

Whether validating automotive BEV traction inverters or qualifying GaN devices for high-speed charging, Autonomous High-Power delivers confidence, accuracy, and scalability in a world powered by advanced semiconductors.

The Autonomous High-Power Measurement Assistant supports the TESLA200 and TESLA300 probe stations for 200 mm and 300 mm wafers.

Applications

  • Power Device Characterization: SiC MOSFETs, GaN HEMTs, IGBTs, HV/HC ICs 
  • Automotive Electrification: EV traction inverters, onboard chargers, powertrain R&D 
  • Renewable Energy & Industrial:  PV inverters, DC fast chargers, motor drives, UPS 

 

Thermal Capability

  • Full-temperature range: -55°C to +250°C
  • TopHat with FlexShield™ creates a dark, EMI-shielded and frost-free environment
  • Optimized airflow for probe and wafer stability

Motorized Positioners

  • Submicron accuracy with integrated encoders and manual override
  • Up to 6 motorized HP positioners
  • TUV safety certified for high-voltage environments

High-Performance Probes

  • Ultra-High Power (UHP), High Current (HCP), and High Voltage (HVP)
  • Supports up to 600 A and 10,000 V
  • Designed for precision and durability across thermal cycles

Optimized Contact Resistance

  • Intelligent Z-overdrive control for each probe touchdown
  • System makes real-time corrective adjustments as needed
  • Includes automated probe cleaning to extend performance

VueTrack™ Software + Microscope Integration

  • Simplifies test setup and sequencing
  • Automates all alignment and temperature transitions
  • Minimizes training needs and increases throughput

  • High Power