Autonomous High-Power

The Autonomous High-Power Measurement Assistant from FormFactor delivers hands-free, 24/7 test automation for power semiconductor devices—even under extreme thermal and electrical conditions. Designed for SiC, GaN, and high-power silicon devices, Auto HP enables fast, accurate, and repeatable over-temperature measurements across single and multi-DUT layouts.

With FormFactor’s Contact Intelligence, operators can start a test and leave the probe station running unattended throughout shifts, overnight, or even over weekends. Contact Intelligence provides fully autonomous probe touchdown control, real-time alignment corrections, and optimized contact resistance during thermal transitions—ensuring reliable data with minimal operator intervention.

Auto HP integrates submicron-accuracy motorized HP positioners, high-performance ultra-high-current and high-voltage probes, and an exclusive TopHat with FlexShield™ to maintain stability from -55°C to +250°C. Dynamic touchdown control and automatic probe cleaning enable the system to adapt intelligently to changing test conditions, optimizing probe lifespan and measurement quality.

Test sequence complexity is greatly reduced with VueTrack™ software and a high-resolution microscope that automate probe adjustments, layout changes, and alignment corrections—even during thermal transitions. Operators simply define the test sequence, and Auto HP manages the rest—maximizing throughput while minimizing manual steps.

Whether validating automotive BEV traction inverters or qualifying GaN devices for high-speed charging, Auto HP delivers confidence, accuracy, and scalability in a world powered by advanced semiconductors.

The Autonomous HP Measurement Assistant supports the TESLA200 and TESLA300 probe stations for 200 mm and 300 mm wafers.