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  • WinCal XE - Automated on-wafer RF Measurement Calibration Software

WinCalXE software is a comprehensive and intuitive on-wafer RF measurement calibration tool to achieve accurate and repeatable S-parameter measurement. The WinCalXE features include exclusive 1-, 2-, 3-, and 4-port calibration algorithms, immediate and live data measurement and viewing, LRRM, LRM+, SOLT-LRRM hybrid and NIST-style multi-line TRL calibrations, as well as an Error Set Management capability for data comparison and augmentation. The latest version, WinCalXE 4.9, covers Infinity, ACP, T-Wave and |Z| Probes, and is compatible with Velox™, Nucleus™ and ProberBench™ probe station control software.

Features:

  • Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
  • Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
  • LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
  • Automatic load inductance compensation function ensures the most repeatable calibrations
  • Easy to use Probe to ISS/CSR matching tool
  • Additional remoting methods
  • Interface with Velox™ over LAN

Free 30 Day WinCal Demo!

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WinCal™ - The Microwave Engineer’s Toolkit

FormFactor's WinCal software is a trusted software tool for achieving the best Vector Network Analyzer calibrations possible with integrated circuit wafer probes. This presentation will leave you saying "Wow, I did not know WinCal could do that!" Features such as the math scratchpad, sequencing capability, the graphing tool, and the remote API will be explained by rich examples.


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MPS150 Modular Probe Station Starting at $13,880

FormFactor’s MPS150 probe station enables fast and precise manual handling of wafers and substrates up to 150 mm. It is the industry’s probe platform of choice for IV/CV, RF, mm-Wave, Terahertz, Load-Pull, High Power, Failure Analysis and Silicon Photonics measurements.

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Flexible Cascade MPS150 Modular 150mm Probe Station

The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm. Pre-configured application-focused probing solutions are available with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The MPS150 is the industry’s probe platform of choice.