We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.
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We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.
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We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.
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FRT Metrology manufactures powerful surface metrology tools for production, development, and quality control. Due to the design and construction of these multi-sensor devices, FRT Metrology tools can be used for multiple wafer and non-wafer applications.
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FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.
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Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.
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Our extensive portfolio of high-performance probe cards help lower production costs, improve yields and enable more-than-Moore packaging technologies.
Our extensive portfolio of high-performance probe cards help lower production costs, improve yields and enable more-than-Moore packaging technologies.
Millimeter wave frequency transmission and active antenna arrays are the backbone of the emerging 5G capabilities. Formfactor’s Pyramid Probe Card with membrane technology is the only production proven solution in the mmWave range. Pyramid, now with higher parallelism capability is the probing solution for the high RF line counts and low inductance requirements needed for 5G applications.
