Cascade

Summit

200 mm manual/ semi-automated probe system

Summit Overview

Precise On-Wafer Device and Process Characterization

High-precision probe system that enables unattended testing at multiple temperatures. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C.

Applications: IV/CV, RF/mmW, Failure Analysis, WLR, MEMS

Summit Key Features

High flexibility

Re-configurable for DC, RF, mmW, FA, WLR and more
Thermal range: -60˚C to 300˚C available
Upgrade path to meet your future needs
Complete solution for small- and large-area multi-site probe cards*
Stable and repeatable measurements over a wide thermal range

* Semi-auto version only.

Advanced shielding solution

Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
Advanced EMI-shielding with PureLine with AttoGuard technologies
Best solution for low-noise and 1/f measurements
Minimize AC and spectral noise
Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range

Ease of use

Locking roll-out stage
Innovative microscope remote control
Intuitive ergonomic stage controls
Quick, safe, and comfortable wafer access
Easy on-wafer navigation
Fast setup and test data gathering

Unattended testing over multiple temperatures*

VueTrack™ technology
High-Temperature Stability (HTS) enhancement
Faster time to data
Improved yields

* Semi-auto version only.

Productivity*

eVue™ digital imaging system
Powerful automation tools
CellView
Enhanced optical visualization, fast set-up, and in-die and wafer navigation
Automatic die-size measurements and wafer alignment
Enables fast sub-die navigation

* Semi-auto version only.

Velox Probe Station Control Software*

User-centered design minimizes training costs and enhances efficiency
Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
Comprehensive alignment functions – from simple wafer alignment and mapping to advanced probe-to-pad alignment over multiple temperatures for autonomous semiconductor test
Simplified operation for inexperienced users: Reduced training costs with Workflow Guide and condensed graphical user interface
VeloxPro option: SEMI E95-compliant test executive software that enables simplified and safe automation of the entire wafer test cycle

*Semi-auto version only.

Videos

Autonomous RF Measurement Assistant

FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.

Autonomous RF Calibration and Wafer Probing Over Temperature at High Frequency

Anthony Lord, Director of the RF Market Segment at FormFactor Inc., demonstrates autonomous calibration monitoring and re-calibration over multiple temperatures at frequencies up to 330GHz.

Broadband S-parameter Measurement to 130 GHz | Anthony Lord

FormFactor RF Market Director Anthony Lord reviews the challenges of making very high frequency measurements over a broad band, especially at millimeter waves. He discusses the need for device modelling and circuit characterization with high accuracy and repeatability, as well as the challenges of making these measurements over temperature (-40 to as high as +175 degrees C).

Turnkey Solution for Load-Pull Modeling and Characterization of 5G Devices and Transistor Circuits

FormFactor has partnered up with Focus Microwaves and Keysight to provide the most advanced turn-key solution for high-frequency fundamental and harmonic load pull measurements up to 110 GHz.