Summit

High flexibility

• Re-configurable for DC, RF, mmW, FA, WLR and more
• Thermal range: -60˚C to 300˚C available
• Upgrade path to meet your future needs
• Complete solution for small- and large-area multi-site probe cards*
• Stable and repeatable measurements over a wide thermal range

* Semi-auto version only.

Advanced shielding solution

• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Advanced EMI-shielding with PureLine with AttoGuard technologies
• Best solution for low-noise and 1/f measurements
• Minimize AC and spectral noise
• Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range

Ease of use

• Locking roll-out stage
• Innovative microscope remote control
• Intuitive ergonomic stage controls
• Quick, safe, and comfortable wafer access
• Easy on-wafer navigation
• Fast setup and test data gathering

Unattended testing over multiple temperatures*

• VueTrack™ technology
• High-Temperature Stability (HTS) enhancement
• Faster time to data
• Improved yields

* Semi-auto version only.

Productivity*

• eVue™ digital imaging system
• Powerful automation tools
• CellView
• Enhanced optical visualization, fast set-up, and in-die and wafer navigation
• Automatic die-size measurements and wafer alignment
• Enables fast sub-die navigation

* Semi-auto version only.

Velox probe station control software*

• Intuitive GUI
• Software joystick for precise, sub-micron positioning
• Easy integration with instrument, testers, and test and measurement software
• Efficient system utilization by novice and expert users
• Prevents damage of probe tips and probe cards throughout the entire measurement cycle
• Fast data collection

* Semi-auto version only.