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  • Summit 11K Probe Station

Precise On-Wafer Device and Process Characterization

High-precision probe system that enables testing at multiple temperatures. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C.

High Flexible Probe System

High flexibility

  • Re-configurable for DC, RF, mmW, FA, WLR and more
  • Thermal range: -60˚C to 300˚C available
  • Upgrade path to meet your future needs
  • Stable and repeatable measurements over a wide thermal range

Advanced Shielding Solution

Advanced shielding solution

  • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
  • Advanced EMI-shielding with PureLine with AttoGuard technologies
  • Best solution for low-noise and 1/f measurements
  • Minimize AC and spectral noise
  • Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range

Manual 3-axis Stage Probing

Ease of use

  • Locking roll-out stage
  • Innovative microscope remote control
  • Intuitive ergonomic stage controls
  • Quick, safe, and comfortable wafer access
  • Easy on-wafer navigation
  • Fast setup and test data gathering


Velox Probe Station Control Software

Velox Probe Station Control Software*

  • Dedicated Velox version for manual probe stations
  • AugmentedAlign tool with on screen markers for improved RF measurement accuracy

  • Failure Analysis
  • IV/CV
  • MEMS
  • Reliability
  • RF/mmW/THz


Broadband S-parameter Measurement to 130 GHz | Anthony Lord

FormFactor RF Market Director Anthony Lord reviews the challenges of making very high frequency measurements over a broad band, especially at millimeter waves. He discusses the need for device modelling and circuit characterization with high accuracy and repeatability, as well as the challenges of making these measurements over temperature (-40 to as high as +175 degrees C).


Load-Pull Tuning with FormFactor’s CM300xi and Focus Microwave’s Low Frequency DELTA Tuners

Focus Microwave’s new low frequency DELTA tuners have been seamlessly integrated onto FormFactor’s CM300xi automated wafer probe station. The solution provides high VSWR fundamental and harmonic tuning and covers a wide frequency range of 1.8 to 40 GHz.


Turnkey Solution for Load-Pull Modeling and Characterization of 5G Devices and Transistor Circuits

FormFactor has partnered up with Focus Microwaves and Keysight to provide the most advanced turn-key solution for high-frequency fundamental and harmonic load pull measurements up to 110 GHz.


eVue IV Microscope

The eVue IV digital imaging system combines extraordinary optical performance with increased productivity.


SourceOne – Certified Pre-Owned Equipment

You want the best price-performance ratio for your wafer probe station? With our Certified Used Equipment we have an attractive option for you.


SourceOne – Factory Refurbishment Program

Extend the use of your probe station for up to another 15 years with our Factory Refurbishment Program.


SourceOne – Trade In / Buy Back Program

We'll take your probe station back for a credit note.