Cascade
Summit – Manual
200 mm manual shielded probe system
Summit - Manual Overview
Precise On-Wafer Device and Process Characterization
High-precision probe system that enables excellent measurement performance for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment and at a temperature range from -60°C to 300°C.
Applications: IV/CV, RF/mmW, Failure Analysis, WLR, Silicon Photonics, MEMSSummit - Manual Key Features
High Flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
Advanced shielding solution
- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
- Advanced EMI-shielding with PureLine with AttoGuard technologies
- Best solution for low-noise and 1/f measurements
- Minimize AC and spectral noise
- Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
Ease of use
- Manual 3-axis stage with ergonomic controls
- Locking roll-out stage
- Fast, accurate “hands on” wafer positioning
- Quick, safe, and comfortable wafer access