Wafer/Multi-chip Cryogenic Systems
Our high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications, including IR-sensor test, radiometric test, DC and RF measurements at cryogenic temperatures. The systems can handle wafers up to 300 mm, and support cold filter, cold shutter and selectable f/value aperture as well as multiple optical instruments like IR radiation sources (black bodies). Up to eight probe positioners and/or a probe card can be integrated. Automatic chip alignment, OCR and wafer mark reading are exclusive features of our fully- and semi-automated systems. Cooling options include liquid helium (LHe), liquid nitrogen (LN2) or cryogen-free cooling. With a large install base of >80 stations worldwide, we bring expertise and technical know-how to provide the right solution for your measurement challenge.
Chip-scale Cryogenic Systems
The HPD Cryogenic Chip-scale Probe Stations tackle problems like long turnaround times, high noise, and low signal capabilities. By employing world class technology and superior cryogenic probing knowledge, these systems enable accurate measurements at cryogenic temperatures.
The HPD Cryostats provide an alternative to more expensive and space consuming dilution refrigerators (DR). These Adiabatic Demagnetization Refrigerators (ADR) are great for applications that do not need the full power of a DR, but still require sub Kelvin temperatures. Our ADRs provide a faster, compact, and less costly path to temperatures a fraction of a degree above absolute zero. The new Continuous ADRs (CADR) allow you to stay cold without ever warming up.
Custom Probe Systems
Customized solutions for a variety of challenging applications