CM300xi Data Sheet
The CM300xi probe station offers measurement accuracy and reliability in a solution that is completely modular – whether it is I-V/C-V, RTN and RF measurements in one semi-automated system, or a fully-automated dual-prober system that handles any combination of 200 mm and 300 mm wafers.
Created: August 16, 2017 | Updated: November 11, 2024 | Type: pdf | Size: 1.25 MB