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High-Power Probes Data Sheet
FormFactor's high-power probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors. Together with Tesla on-wafer power device characterization system, FormFactor’s high-power probes achieve reliable and repeatable on-wafer measurements up to 300 A and 10,000 V.
Created: August 16, 2017 | Updated: February 16, 2023 | Type: pdf | Size: 855.36 KB