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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
300 mm Systems
Cascade 300 mm probe stations set the standard for manual and automated on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
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CM300xi
300 mm semi-/ fully-automated probe system
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CM300xi-ULN
300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements
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CM300xi-SiPh
300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant
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TESLA300
300 mm semi-/ fully-automated on-wafer power device characterization system
Power Systems
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. FormFactor offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
Integrated Measurement Systems
FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.
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IMS-K-mmW/THz
Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz
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IMS-K-Load-Pull
Integrated Measurement System with Keysight VNAs and Focus Microwaves tuners for On-Wafer Load-Pull Measurements
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IMS-K-LFN
Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
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IMS-K-DC
Integrated system with Keysight SPA for DC parametric measurements
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IMS-K-Power
Integrated system with Keysight PDA for power semiconductor device characterization
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IMS-K-SiPh
Integrated system with Keysight Photonics Application Suite hardware and software
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