In wafer-level testing, even small improvements in automation or data handling can have a big impact on yield and productivity. For test engineers and lab managers, software is often the quiet hero, the layer that ties precision hardware, metrology tools, and data systems together into one seamless, high-performance environment.

FormFactor’s Velox™ probe station software platform has long played that role. It serves as the control center for our probe stations, ensuring consistent, repeatable measurements while simplifying everything from device setup to test execution. With the release of Velox 3.4.5, we’re taking that integration to the next level by introducing enhanced cleaning capabilities, smarter automation, and more powerful scripting to help customers accelerate workflows and strengthen the connection between lab and fab.

Velox 3.4.5 brings a set of user-driven updates designed to make wafer test operations faster and easier. Engineers will see immediate improvements in setup time, accuracy, repeatability, and day-to-day productivity.

Here’s what stands out:

  • Advanced Probe Cleaning Capabilities – New cleaning patterns (Diagonal, Optimal, and Probe Scrub) provide more efficient use of cleaning pad real estate while maintaining probe tip integrity.
  • Upgraded Workflow Guide – Modernized interface with new Quick Start Workflows to simplify setup, standardize test procedures, and support training and onboarding.
  • Improved Motorized Positioner Setup – North/South layouts added to make positioner selection and visualization more intuitive in both the Control Center and initialization dialog.
  • Expanded Autonomous Assistants – Autonomous RF now supports North/South probe configurations for true unattended 24/7 calibration and measurement, while the new Autonomous High-Power Measurement Assistant automates high-current and high-voltage tests for robust, hands-free operation.
  • Enhanced Scripting & Python Capabilities – For a more intuitive flow, popular packages are pre-installed.

Together, these updates enhance usability and repeatability while minimizing manual steps—helping test teams run faster, more consistent experiments with fewer interruptions.

Smarter Alignment and Visualization

For applications that demand absolute precision, Velox 3.4.5 refines the alignment experience with improvements to Augmented Align.

New visual location markers for North/South probes make it easier to position RF, mmW, and THz probes—even when they’re partially out of focus—resulting in faster calibration and more accurate, repeatable contact.

Expanded Scripting and Data Analysis

The new release significantly enhances Velox’s scripting capabilities with a CPython-based Python 3 implementation.

Preloaded with scientific libraries such as NumPy, SciPy, Matplotlib, Pandas, and Scikit-rf, the scripting environment allows engineers to automate advanced tasks, perform in-depth data analysis, and integrate seamlessly with external systems.

Velox 3.4.5 also includes VSCodium, an open-source development environment offering syntax highlighting and debugging tools for Python and other languages—giving users a ready-to-use platform for advanced automation and customization right out of the box.

Built for Precision, Performance, and Flexibility

Semiconductor testing gets tougher every year as device geometries shrink and architectures become more complex. Velox 3.4.5 was built to help engineers stay ahead of those challenges, offering smarter automation and more detailed data capture to ensure no signal or parameter goes unnoticed.

When paired with FormFactor’s industry-leading probe cards and wafer probe systems, Velox enables:

  • Faster setup and test at advanced nodes (3 nm and below)
  • Higher data repeatability and confidence across test cycles
  • Scalable workflows for chiplet architectures and 3D integration

From AI accelerators and high-bandwidth memory to automotive-grade semiconductors, these improvements translate directly into higher yield, shorter test times, and lower cost per wafer.

Every new feature in Velox is shaped by customer feedback. Version 3.4.5 reflects what we’ve learned from engineers in fabs and labs around the world, those who rely on our systems every day to push the limits of semiconductor performance.

That collaboration is what drives the platform forward. As the industry moves deeper into chiplet-based design, AI-driven workloads, and advanced packaging, we’re committed to providing software that keeps pace, delivering the precision, consistency, and speed engineers need to stay ahead.

To see the new features in action, check out the on-demand webinar where FormFactor experts walk through Velox 3.4.5 in detail and share real-world examples of how these updates improve performance.

Watch the Velox 3.4.5 Webinar
Download the Velox 3.4.5 Highlights Flyer

As semiconductor technologies continue to evolve, Velox remains the software backbone of precision wafer testing, ensuring that every probe, every contact, and every data point contributes to better yield and faster innovation.