PM8DSP Data Sheet
The PM8DSP is the most precise and flexible manual double side test solution for wafers and substrates up to 200 mm. It is ideal for all applications requiring access from both, the top and back sides, of the wafer, such as failure analysis with emission microscopes, optoelectronic test (e.g. spectrum analysis), MEMS test (e.g. Si-microphones) and testing 3D stacks like through-silicon vias (TSVs).
Created: August 16, 2017 | Updated: January 23, 2020 | Type: pdf | Size: 1.42 MB