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T300 Data Sheet
Designed specifically for testing power devices on wafer, the Tesla T300 system is engineered to withstand probing levels of up to 3000 V (triaxial)/10,000 V (coaxial) and 200A (pulsed)/10 A (DC), and supports a measurement temperature range of -55° to 300°C. In combination with FormFactor’s patented Microchamber, the T300 features a state-of-the-art chuck to ensure low-contact resistance, while providing a low-noise, fully guarded and shielded test environment.
Created: August 16, 2017 | Updated: December 16, 2020 | Type: pdf | Size: 751.23 KB