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Tesla System Q & A
Up until now, power device manufacturers were forced to package their devices prior to testing due to a lack of support for higher voltage and current testing from probe station manufacturers. This was a problembecause it adds time and cost to the development schedule and gives them no real option for KGD sort. FormFactor’s Tesla on-wafer characterization system for power devices is the solution to this challenge.
Created: August 17, 2017 | Updated: March 14, 2019 | Type: pdf | Size: 123.90 KB