200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade 200 mm wafer probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
Reliability Test Systems
Cascade reliability test systems grow with your needs. Whether you start with the Symphony test system for small WLR applications or the 1164 test system for large PLR or WLR applications - the modular, scalable design allows easy expansion in the future
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
For MEMS devices that require test in a high vacuum or controlled pressure environment, and for IR imaging devices or cutting edge technologies that require testing at cryogenic temperatures, our special vacuum, pressure and cryogenic probe stations enable precise on-wafer measurements in extreme environments.
Custom Probe Systems
Customized solutions for a variety of challenging applications