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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
Integrated Measurement Systems
FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.
Wafer/Multi-chip Cryogenic Systems
Our wafer/multi-chip probe systems for Quantum Cryogenics include high precision, fully-automated probe stations for 150 mm and 200 mm substrates in a 4 K environment. FormFactor’s longstanding probing expertise and decades of precision cryogenic experience come together in these systems to take superconducting device test and measurement out of the lab into the fab.
Chip-scale Cryogenic Systems
The HPD Cryogenic Chip-scale Probe Stations tackle problems like long turnaround times, high noise, and low signal capabilities. By employing world class technology and superior cryogenic probing knowledge, these systems enable accurate measurements at cryogenic temperatures.
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